Some results concerning 2-D on-line tessellation acceptors and 2-D alternating finite automata

1991 ◽  
pp. 221-230 ◽  
Author(s):  
Oscar H. Ibarra ◽  
Tao Jiang ◽  
Hui Wang
Keyword(s):  
Finite Automata ◽  
On Line

A CHARACTERIZATION OF RECOGNIZABLE PICTURE LANGUAGES

1994 ◽  
Vol 08 (02) ◽  
pp. 501-508 ◽  
Author(s):  
KATSUSHI INOUE ◽  
ITSUO TAKANAMI
Keyword(s):  
Finite Automata ◽  
Two Dimensional ◽  
Open Problems ◽  
Nondeterministic Finite Automata ◽  
Letter Alphabet ◽  
The Family ◽  
On Line ◽  
Picture Languages

This paper first shows that REC, the family of recognizable picture languages in Giammarresi and Restivo,3 is equal to the family of picture languages accepted by two-dimensional on-line tessellation acceptors in Inoue and Nakamura.5 By using this result, we then solve open problems in Giammarresi and Restivo,3 and show that (i) REC is not closed under complementation, and (ii) REC properly contains the family of picture languages accepted by two-dimensional nondeterministic finite automata even over a one letter alphabet.

scholarly journals Some results concerning 2-D on-line tessellation acceptors and 2-D alternating finite automata

1994 ◽  
Vol 125 (2) ◽  
pp. 243-257 ◽  
Author(s):  
Tao Jiang ◽  
Oscar H. Ibarra ◽  
Hui Wang
Keyword(s):  
Finite Automata ◽  
On Line

The on-line use of histogram data for high-speed correction and alignment of electron microscope images

1984 ◽  
Vol 42 ◽  
pp. 556-557
Author(s):  
William Krakow
Keyword(s):  
Power Spectrum ◽  
High Speed ◽  
Direct Memory Access ◽  
Digital Television ◽  
Contrast Transfer Function ◽  
The Past ◽  
High Resolution Tem ◽  
On Line ◽  
Correction Of Astigmatism ◽  
The Fourier Transform

In the past few years on-line digital television frame store devices coupled to computers have been employed to attempt to measure the microscope parameters of defocus and astigmatism. The ultimate goal of such tasks is to fully adjust the operating parameters of the microscope and obtain an optimum image for viewing in terms of its information content. The initial approach to this problem, for high resolution TEM imaging, was to obtain the power spectrum from the Fourier transform of an image, find the contrast transfer function oscillation maxima, and subsequently correct the image. This technique requires a fast computer, a direct memory access device and even an array processor to accomplish these tasks on limited size arrays in a few seconds per image. It is not clear that the power spectrum could be used for more than defocus correction since the correction of astigmatism is a formidable problem of pattern recognition.

Image registration with a computer driven S.T.E.M.

1978 ◽  
Vol 36 (1) ◽  
pp. 98-99
Author(s):  
A.M.H. Schepman ◽  
J.A.P. van der Voort ◽  
J.E. Mellema
Keyword(s):  
Spot Size ◽  
Scanning Transmission Electron Microscope ◽  
Small Computer ◽  
Structural Studies ◽  
Area Of Interest ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Specimen Area ◽  
On Line ◽  
Minimum Distances

A Scanning Transmission Electron Microscope (STEM) was coupled to a small computer. The system (see Fig. 1) has been built using a Philips EM400, equipped with a scanning attachment and a DEC PDP11/34 computer with 34K memory. The gun (Fig. 2) consists of a continuously renewed tip of radius 0.2 to 0.4 μm of a tungsten wire heated just below its melting point by a focussed laser beam (1). On-line operation procedures were developped aiming at the reduction of the amount of radiation of the specimen area of interest, while selecting the various imaging parameters and upon registration of the information content. Whereas the theoretical limiting spot size is 0.75 nm (2), routine resolution checks showed minimum distances in the order 1.2 to 1.5 nm between corresponding intensity maxima in successive scans. This value is sufficient for structural studies of regular biological material to test the performance of STEM over high resolution CTEM.

Sign in / Sign up

Export Citation Format

Share Document