Purpose
The purpose of this paper is to consider the general k level step-stress accelerated life test with the Rayleigh lifetime distribution for units subjected to stress under progressive Type-I censoring.
Design/methodology/approach
The parameter of this distribution is assumed to be a log-linear function of the stress, and a tampered failure rate model holds. The progressive Type-I censoring reduces the cost of testing. Due to constrained resources in practice, the test design must be optimized carefully. A numerical study is conducted to illustrate the optimum test design based on several four optimality criteria under the constraint that the total experimental cost does not exceed a pre-specified budget.
Findings
This paper compares unconstrained and constrained optimal k level step-stress test. Based on the results of the simulation study, the cost constraint reduces cost and time of the test and it also, in the most cases, increases the efficiency of the test. Also, the T-optimal design is lowest cost and time for testing and it is found more optimal in both conditions.
Originality/value
In this paper, various optimization criteria for selecting the stress durations have been used, and these criteria are compared together. Also, because of affecting the stress durations on the experimental cost, the author optimize under the constraint that the total experimental cost does not exceed a pre-specified budget. The efficiency of the unconstrained test in comparison with constrained test is discussed.
A Progressive Interval Type-I Censored Life Test Plan for Rayleigh Distribution