Towards Time-Resolved Dynamic Atomic Force Microscopy

2004 ◽  
pp. 749-756
Author(s):  
R. W. Stark ◽  
G. Schitter ◽  
M. Stark ◽  
R. Guckenberger ◽  
A. Stemmer
Keyword(s):  
Atomic Force Microscopy ◽  
Time Resolved ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Review of time-resolved non-contact electrostatic force microscopy techniques with applications to ionic transport measurements

2019 ◽  
Vol 10 ◽  
pp. 617-633 ◽  
Author(s):  
Aaron Mascaro ◽  
Yoichi Miyahara ◽  
Tyler Enright ◽  
Omur E Dagdeviren ◽  
Peter Grütter
Keyword(s):  
Atomic Force Microscopy ◽  
Electrostatic Force ◽  
Oscillation Period ◽  
Electrostatic Force Microscopy ◽  
Time Varying ◽  
Time Resolved ◽  
Battery Materials ◽  
Force Microscopy ◽  
Atomic Force ◽  
Microscopy Techniques

Recently, there have been a number of variations of electrostatic force microscopy (EFM) that allow for the measurement of time-varying forces arising from phenomena such as ion transport in battery materials or charge separation in photovoltaic systems. These forces reveal information about dynamic processes happening over nanometer length scales due to the nanometer-sized probe tips used in atomic force microscopy. Here, we review in detail several time-resolved EFM techniques based on non-contact atomic force microscopy, elaborating on their specific limitations and challenges. We also introduce a new experimental technique that can resolve time-varying signals well below the oscillation period of the cantilever and compare and contrast it with those previously established.

scholarly journals Time-resolved open-circuit conductive atomic force microscopy for direct electromechanical characterisation

2020 ◽  
Vol 31 (40) ◽  
pp. 404003 ◽  
Author(s):  
Yonatan Calahorra ◽  
Wonjong Kim ◽  
Jelena Vukajlovic-Plestina ◽  
Anna Fontcuberta i Morral ◽  
Sohini Kar-Narayan
Keyword(s):  
Atomic Force Microscopy ◽  
Open Circuit ◽  
Conductive Atomic Force Microscopy ◽  
Time Resolved ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Time-Resolved Single Molecule Microscopy Coupled with Atomic Force Microscopy

2012 ◽  
Vol 102 (3) ◽  
pp. 587a
Author(s):  
Marcelle Koenig ◽  
Marcus Sackrow ◽  
Samantha Fore ◽  
Felix Koberling ◽  
Uwe Ortmann ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Single Molecule ◽  
Single Molecule Microscopy ◽  
Time Resolved ◽  
Force Microscopy ◽  
Atomic Force

Time-resolved single molecule microscopy coupled with atomic force microscopy

2012 ◽  
Author(s):  
M. König ◽  
F. Koberling ◽  
O. Schulz ◽  
R. Ros ◽  
S. Fore ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Single Molecule ◽  
Single Molecule Microscopy ◽  
Time Resolved ◽  
Force Microscopy ◽  
Atomic Force

Structural Evolution and Alignment of Cylinder-Forming PS-b-PEP Thin Films in Confinement Studied by Time-Lapse Atomic Force Microscopy

2004 ◽  
Vol 854 ◽  
Author(s):  
Qin Zheng ◽  
Dong-Chan Lee ◽  
Luping Yu ◽  
S. J. Sibener
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
High Temperature ◽  
Intermediate State ◽  
Structural Evolution ◽  
Time Lapse ◽  
Time Resolved ◽  
Force Microscopy ◽  
Atomic Force ◽  
Sample Spot

ABSTRACTWe have utilized time-resolved high-temperature atomic force microscopy (AFM) to investigate the mechanism by which topographic templates induce alignment of cylinder-forming diblock copolymer thin films. By tracking the same sample spot during thermal annealing, we observed that the structural evolution and alignment of thin films in confinement involve an intermediate state with disordered morphology and the evolution and annihilation of disclination quadrupoles guided by the channel edges, which ultimately lead to the essentially perfect alignment of cylindrical microdomains.

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