Imaging and Characterization of Wear Behavior in WC+Co Coating and 45# Steel by Scanning Electron Acoustic Microscopy

Acoustical Imaging ◽

10.1007/978-1-4615-3370-2_123 ◽

1992 ◽

pp. 779-783 ◽

Cited By ~ 1

Author(s):

F. M. Jiang ◽

S. X. Hui ◽

Q. R. Yin

Keyword(s):

Wear Behavior ◽

Acoustic Microscopy ◽

Electron Acoustic ◽

Scanning Electron

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Nondestructive defect characterization of saw-damage-etched multicrystalline silicon wafers using scanning electron acoustic microscopy

2012 IEEE 38th Photovoltaic Specialists Conference (PVSC) PART 2 ◽

10.1109/pvsc-vol2.2013.6656761 ◽

2013 ◽

Author(s):

Lei Meng ◽

Satyavolu S. Papa Rao ◽

Charanjit S. Bhatia ◽

Steven E. Steen ◽

Alan G. Street ◽

...

Keyword(s):

Silicon Wafers ◽

Acoustic Microscopy ◽

Multicrystalline Silicon ◽

Defect Characterization ◽

Electron Acoustic ◽

Scanning Electron

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CHARACTERIZATION OF SEMIINSULATING GaAs : Cr BY SCANNING ELECTRON ACOUSTIC MICROSCOPY

Journal de Physique IV (Proceedings) ◽

10.1051/jp4:1991644 ◽

1991 ◽

Vol 01 (C6) ◽

pp. C6-295-C6-296

Author(s):

B. MÉNDEZ ◽

J. PIQUERAS

Keyword(s):

Acoustic Microscopy ◽

Electron Acoustic ◽

Scanning Electron

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Domain characterization of Pb(Zn[sub 1/3]Nb[sub 2/3])O[sub 3]−(6%–7%)PbTiO[sub 3] single crystals using scanning electron acoustic microscopy

Journal of Applied Physics ◽

10.1063/1.2988179 ◽

2008 ◽

Vol 104 (7) ◽

pp. 074103 ◽

Cited By ~ 2

Author(s):

Meng Fei Wong ◽

Xiangxin Heng ◽

Kaiyang Zeng

Keyword(s):

Single Crystals ◽

Acoustic Microscopy ◽

Electron Acoustic ◽

Scanning Electron

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Application of scanning electron acoustic microscopy (SEAM) to the characterization of semiconducting materials and devices

Microscopy of Semiconducting Materials, 1987 ◽

10.1201/9781003069621-106 ◽

2020 ◽

pp. 675-684

Author(s):

L J Balk ◽

N Kultscher

Keyword(s):

Acoustic Microscopy ◽

Semiconducting Materials ◽

Electron Acoustic ◽

Scanning Electron

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Nondestructive Defect Characterization of Saw-Damage-Etched Multicrystalline Silicon Wafers Using Scanning Electron Acoustic Microscopy

IEEE Journal of Photovoltaics ◽

10.1109/jphotov.2012.2218579 ◽

2013 ◽

Vol 3 (1) ◽

pp. 370-374 ◽

Cited By ~ 1

Author(s):

Lei Meng ◽

Satyavolu S. Papa Rao ◽

Charanjit S. Bhatia ◽

Steven E. Steen ◽

Alan G. Street ◽

...

Keyword(s):

Silicon Wafers ◽

Acoustic Microscopy ◽

Multicrystalline Silicon ◽

Defect Characterization ◽

Electron Acoustic ◽

Scanning Electron

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Nondestructive defect characterization of saw-damage-etched multicrystalline silicon wafers using scanning electron acoustic microscopy

2012 IEEE 38th Photovoltaic Specialists Conference (PVSC) PART 2 ◽

10.1109/pvsc-vol2.2012.6656761 ◽

2012 ◽

Author(s):

Lei Meng ◽

Satyavolu S. Papa Rao ◽

Charanjit S. Bhatia ◽

Steven E. Steen ◽

Alan G. Street ◽

...

Keyword(s):

Silicon Wafers ◽

Acoustic Microscopy ◽

Multicrystalline Silicon ◽

Defect Characterization ◽

Electron Acoustic ◽

Scanning Electron

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Characterization of tribological surfaces by scanning electron acoustic microscopy

Wear ◽

10.1016/0043-1648(87)90272-9 ◽

1987 ◽

Vol 116 (1) ◽

pp. 119-129 ◽

Cited By ~ 3

Author(s):

W.L. Holstein ◽

F.E. Schmidt ◽

B.C. Begnoche

Keyword(s):

Acoustic Microscopy ◽

Tribological Surfaces ◽

Electron Acoustic ◽

Scanning Electron

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The Observation of Martensite and Magnetic Domain Structures in Ni 53 Mn 24 Ga 23 Shape Memory Alloys by Scanning Electron Acoustic Microscopy and Scanning Thermal Microscopy

Chinese Physics Letters ◽

10.1088/0256-307x/29/5/050702 ◽

2012 ◽

Vol 29 (5) ◽

pp. 050702

Author(s):

Kun-Yu Zhao ◽

Hua-Rong Zeng ◽

Hong-Zhang Song ◽

Sen-Xing Hui ◽

Guo-Rong Li ◽

...

Keyword(s):

Shape Memory Alloys ◽

Shape Memory ◽

Magnetic Domain ◽

Acoustic Microscopy ◽

Scanning Thermal Microscopy ◽

Thermal Microscopy ◽

Domain Structures ◽

Electron Acoustic ◽

Scanning Electron

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Study of Laser Annealed Ferromagnetic Amorphous Ribbons by Scanning Electron-Acoustic Microscopy

Acoustical Imaging ◽

10.1007/978-1-4615-2958-3_36 ◽

1993 ◽

pp. 265-271

Author(s):

M. Urchulutegui ◽

J. Piqueras ◽

I. Tanarro ◽

C. Aroca

Keyword(s):

Acoustic Microscopy ◽

Amorphous Ribbons ◽

Electron Acoustic ◽

Scanning Electron

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Capacitive Transducers for Scanning Electron Acoustic Microscopy (SEAM)

Acoustical Imaging ◽

10.1007/978-1-4615-3370-2_122 ◽

1992 ◽

pp. 773-777

Author(s):

M. Domnik ◽

L. J. Balk ◽

E. Kubalek

Keyword(s):

Acoustic Microscopy ◽

Capacitive Transducers ◽

Electron Acoustic ◽

Scanning Electron

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