Energy Dispersive Grazing Incidence X-ray Diffraction Study on Organic Thin Films Epitaxially Grown on Crystalline Substrate

1997 ◽  
pp. 659-664
Author(s):  
Kenji Ishida ◽  
Akinori Kita ◽  
Kouichi Hayashi ◽  
Toshihisa Horiuchi ◽  
Kazumi Matsushige ◽  
...  
Keyword(s):  
Thin Films ◽  
Diffraction Study ◽  
Organic Thin Films ◽  
Grazing Incidence ◽  
Energy Dispersive ◽  
X Ray Diffraction ◽  
X Ray ◽  
Crystalline Substrate

Energy Dispersive Grazing Incidence X-ray Diffraction Study on Organic Thin Films EpitaxiaHy Grown on Crystalline Substrate

1995 ◽  
Vol 39 ◽  
pp. 659-664 ◽  
Author(s):  
Kenji Ishida ◽  
Akinori Kita ◽  
Kouichi Hayashi ◽  
Toshihisa Horiuchi ◽  
Shoichi Kal ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Film Studies ◽  
Organic Thin Films ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
X Ray ◽  
Structural Evaluation ◽  
Crystalline Substrate ◽  
Scattering Volume

Thin film technology is rapidly evolving today, and the characterization of the thin film and its surface have become very important issue not only from scientific but also technological viewpoints. Although x-ray diffraction measurements have been used as suitable evaluation methods in crystallography studies, its application to the structural evaluation of the thin films, especially organic one having the low electron densities, is not easy due to the small amounts of scattering volume and the high obstructive scattering noise from the substrate. However, the x-ray diffraction measurements under grazing incidence will aid not only in overcoming the such problems but also in analyzing in-plane structure of the thin films. Therefore, so-called grazing incidence x-ray diffraction (GIXD) has been recognized as one of the most powerful tools for the surface and thin film studies.

In situ Characterization of Functional Organic Thin Films by Energy Dispersive Grazing Incidence X-ray Diffraction

1997 ◽  
Vol 502 ◽  
Author(s):  
Yuji Yoshida ◽  
Hiroshi Takiguchi ◽  
Nobutaka Tanigaki ◽  
Kiyoshi Yase
Keyword(s):  
Thin Films ◽  
Growth Process ◽  
Organic Thin Films ◽  
Grazing Incidence ◽  
Energy Dispersive ◽  
Vacuum System ◽  
Initial Growth ◽  
X Ray Diffraction ◽  
X Ray

ABSTRACTWe are investigating well-ordered highly crystalline thin films made using organic molecular beam deposition (OMBD) since it is important to control the formation mechanism at the initial growth process. Then, we developed a new in situ technique of energy dispersive grazing incidence X-ray diffraction utilized within an ultrahigh vacuum system. This technique (in situ ED-GID) makes it possible to examine the crystal structure, orientation and morphology of organic thin films during deposition without any damage to the film. In the present review, we examined the growth process of thin films of functional organic dyes, fullerene (C60) and p-sexiphenyl (6P) by using this in situ ED-GID. The crystal strucutre and molecular orientation in epitaxially-grown thin films were confirmed during the initial stages of growth. Also, the morphology of C60 thin films was examined during the deposition. As a result, it was confirmed that the decay curves of X-ray fluorescence indicate different island growth in C60 thin films.

scholarly journals 3D-structural Analysis of Epitaxially-grown Organic Thin Films by a Newly Developed Energy Dispersive X-ray Diffraction System.

Hyomen Kagaku ◽  
1998 ◽  
Vol 19 (4) ◽  
pp. 259-264
Author(s):  
Kenji ISHIDA ◽  
Toshihisa HORIUCHI ◽  
Kazumi MATSUSHIGE MATSUSHIGE
Keyword(s):  
Thin Films ◽  
Structural Analysis ◽  
Organic Thin Films ◽  
Energy Dispersive ◽  
X Ray Diffraction ◽  
X Ray

Quantitative structural analysis of organic thin films: An x-ray diffraction study

2005 ◽  
Vol 72 (10) ◽  
Author(s):  
Casey W. Miller ◽  
A. Sharoni ◽  
G. Liu ◽  
C. N. Colesniuc ◽  
B. Fruhberger ◽  
...  
Keyword(s):  
Thin Films ◽  
Structural Analysis ◽  
Diffraction Study ◽  
Organic Thin Films ◽  
X Ray Diffraction ◽  
X Ray

Electron beam deposited VC and NbC thin films on titanium: Hardness and energy-dispersive X-ray diffraction study

2008 ◽  
Vol 202 (10) ◽  
pp. 2162-2168 ◽  
Author(s):  
D. Ferro ◽  
J.V. Rau ◽  
A. Generosi ◽  
V. Rossi Albertini ◽  
A. Latini ◽  
...  
Keyword(s):  
Thin Films ◽  
Electron Beam ◽  
Diffraction Study ◽  
Energy Dispersive ◽  
X Ray Diffraction ◽  
X Ray

Grazing-incidence X-ray diffraction study of rubrene epitaxial thin films

2012 ◽  
Vol 19 (5) ◽  
pp. 682-687 ◽  
Author(s):  
Enrico Fumagalli ◽  
Marcello Campione ◽  
Luisa Raimondo ◽  
Adele Sassella ◽  
Massimo Moret ◽  
...  
Keyword(s):  
Thin Films ◽  
Diffraction Study ◽  
Grazing Incidence ◽  
Epitaxial Thin Films ◽  
X Ray Diffraction ◽  
X Ray
Sign in / Sign up

Export Citation Format

Share Document