scholarly journals Grazing-incidence x-ray diffraction study of pentacene thin films with the bulk phase structure

2006 ◽  
Vol 89 (10) ◽  
pp. 101919 ◽  
Author(s):  
Hiroyuki Yoshida ◽  
Naoki Sato
2012 ◽  
Vol 19 (5) ◽  
pp. 682-687 ◽  
Author(s):  
Enrico Fumagalli ◽  
Marcello Campione ◽  
Luisa Raimondo ◽  
Adele Sassella ◽  
Massimo Moret ◽  
...  

1997 ◽  
pp. 659-664
Author(s):  
Kenji Ishida ◽  
Akinori Kita ◽  
Kouichi Hayashi ◽  
Toshihisa Horiuchi ◽  
Kazumi Matsushige ◽  
...  

2002 ◽  
Vol 41 (Part 1, No. 8) ◽  
pp. 5467-5471 ◽  
Author(s):  
Masato Ofuji ◽  
Katsuhiko Inaba ◽  
Kazuhiko Omote ◽  
Hajime Hoshi ◽  
Yoichi Takanishi ◽  
...  

2005 ◽  
Vol 53 (3) ◽  
pp. 213-222 ◽  
Author(s):  
Hirohiko Yakabe ◽  
Keiji Tanaka ◽  
Toshihiko Nagamura ◽  
Sono Sasaki ◽  
Osami Sakata ◽  
...  

2011 ◽  
Vol 44 (5) ◽  
pp. 983-990 ◽  
Author(s):  
Chris Elschner ◽  
Alexandr A. Levin ◽  
Lutz Wilde ◽  
Jörg Grenzer ◽  
Christian Schroer ◽  
...  

The electrical and optical properties of molecular thin films are widely used, for instance in organic electronics, and depend strongly on the molecular arrangement of the organic layers. It is shown here how atomic structural information can be obtained from molecular films without further knowledge of the single-crystal structure. C60 fullerene was chosen as a representative test material. A 250 nm C60 film was investigated by grazing-incidence X-ray diffraction and the data compared with a Bragg–Brentano X-ray diffraction measurement of the corresponding C60 powder. The diffraction patterns of both powder and film were used to calculate the pair distribution function (PDF), which allowed an investigation of the short-range order of the structures. With the help of the PDF, a structure model for the C60 molecular arrangement was determined for both C60 powder and thin film. The results agree very well with a classical whole-pattern fitting approach for the C60 diffraction patterns.


1995 ◽  
Vol 34 (Part 1, No. 11) ◽  
pp. 6036-6040
Author(s):  
A. Z. Moshfegh ◽  
A. H. Fatollahi ◽  
Y. Q. Wang ◽  
Y. Y. Sun ◽  
P. H. Hor ◽  
...  

2010 ◽  
Vol 93-94 ◽  
pp. 231-234
Author(s):  
B. Hongthong ◽  
Satreerat K. Hodak ◽  
Sukkaneste Tungasmita

Strontium substituted hydroxyapatite(SrHAp) were fabricated both in the form of powder as reference and thin film by using inorganic precursor reaction. The sol-gel process has been used for the deposition of SrHAp layer on stainless steal 316L substrate by spin coating technique, after that the films were annealed in air at various temperatures. The chemical composition of SrHAp is represented (SrxCa1-x)5(PO4)3OH, where x is equal to 0, 0.5 and 1.0. Investigations of the phase structure of SrHAp were carried out by using X-ray diffraction technique (XRD). The results showed that strontium is incorporated into hydroxyapatite where its substitution for calcium increases in the lattice parameters, and Sr3(PO4)2 can be detected at 900°C. The SEM micrographs showed that SrHAp films exhibited porous structure before develop to a cross-linking structure.


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