Test Generation for Path Delay Faults

1998 ◽  
pp. 101-130
Author(s):  
Angela Krstić ◽  
Kwang-Ting Cheng
Keyword(s):  
Test Generation ◽  
Delay Faults ◽  
Path Delay ◽  
Path Delay Faults

Function-Based Test Generation for (Non-Robust) Path Delay Faults Using the Launch-off-Capture Scan Architecture

2007 ◽  
Author(s):  
Rajsekhar Adapa ◽  
Edward Flanigan ◽  
Spyros Tragoudas ◽  
Michael Laisne ◽  
Hailong Cui ◽  
...  
Keyword(s):  
Test Generation ◽  
Delay Faults ◽  
Path Delay ◽  
Path Delay Faults

Efficient test generation algorithm for path delay faults

2000 ◽  
Vol 36 (1) ◽  
pp. 13
Author(s):  
Myoung-Gyun Kim ◽  
Sungho Kang
Keyword(s):  
Test Generation ◽  
Delay Faults ◽  
Path Delay ◽  
Path Delay Faults ◽  
Generation Algorithm ◽  
Efficient Test

Test generation for path delay faults using binary decision diagrams

1995 ◽  
Vol 44 (3) ◽  
pp. 434-447 ◽  
Author(s):  
D. Bhattacharya ◽  
P. Agrawal ◽  
V.D. Agrawal
Keyword(s):  
Test Generation ◽  
Binary Decision Diagrams ◽  
Decision Diagrams ◽  
Delay Faults ◽  
Path Delay ◽  
Path Delay Faults ◽  
Binary Decision
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