Deterministic broadside test generation for transition path delay faults

Proceedings of the 20th symposium on Great lakes symposium on VLSI - GLSVLSI '10 ◽

10.1145/1785481.1785514 ◽

2010 ◽

Cited By ~ 1

Author(s):

Bo Yao ◽

Irith Pomeranz ◽

Sudhakar M. Reddy

Keyword(s):

Test Generation ◽

Delay Faults ◽

Path Delay ◽

Path Delay Faults ◽

Transition Path

Download Full-text

NEST: a nonenumerative test generation method for path delay faults in combinational circuits

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/43.476581 ◽

1995 ◽

Vol 14 (12) ◽

pp. 1505-1515 ◽

Cited By ~ 30

Author(s):

I. Pomeranz ◽

S.M. Reddy ◽

P. Uppaluri

Keyword(s):

Test Generation ◽

Delay Faults ◽

Path Delay ◽

Combinational Circuits ◽

Path Delay Faults

Download Full-text

Function-Based Test Generation for (Non-Robust) Path Delay Faults Using the Launch-off-Capture Scan Architecture

8th International Symposium on Quality Electronic Design (ISQED'07) ◽

10.1109/isqed.2007.81 ◽

2007 ◽

Cited By ~ 2

Author(s):

Rajsekhar Adapa ◽

Edward Flanigan ◽

Spyros Tragoudas ◽

Michael Laisne ◽

Hailong Cui ◽

...

Keyword(s):

Test Generation ◽

Delay Faults ◽

Path Delay ◽

Path Delay Faults

Download Full-text

An efficient automatic test generation system for path delay faults in combinational circuits

Proceedings of the 8th International Conference on VLSI Design ◽

10.1109/icvd.1995.512097 ◽

2002 ◽

Cited By ~ 12

Author(s):

A.K. Majhi ◽

J. Jacob ◽

L.M. Patnaik ◽

V.D. Agrawal

Keyword(s):

Test Generation ◽

Delay Faults ◽

Path Delay ◽

Combinational Circuits ◽

Path Delay Faults ◽

Generation System ◽

Automatic Test Generation ◽

Automatic Test

Download Full-text

A test generation system for path delay faults

Proceedings 1989 IEEE International Conference on Computer Design: VLSI in Computers and Processors ◽

10.1109/iccd.1989.63324 ◽

2003 ◽

Cited By ~ 23

Author(s):

S. Patil ◽

S.M. Reddy

Keyword(s):

Test Generation ◽

Delay Faults ◽

Path Delay ◽

Path Delay Faults ◽

Generation System

Download Full-text

Test generation for path delay faults based on learning

Proceedings of 1993 International Conference on Computer Aided Design (ICCAD) ◽

10.1109/iccad.1993.580092 ◽

2002 ◽

Cited By ~ 7

Author(s):

I. Pomeranz ◽

S.M. Reddy

Keyword(s):

Test Generation ◽

Delay Faults ◽

Path Delay ◽

Path Delay Faults

Download Full-text

Robust test generation for power supply noise induced path delay faults

2008 Asia and South Pacific Design Automation Conference ◽

10.1109/aspdac.2008.4484033 ◽

2008 ◽

Cited By ~ 1

Author(s):

Xiang Fu ◽

Huawei Li ◽

Yu Hu ◽

Xiaowei Li

Keyword(s):

Power Supply ◽

Test Generation ◽

Delay Faults ◽

Path Delay ◽

Power Supply Noise ◽

Path Delay Faults ◽

Robust Test ◽

Supply Noise ◽

Induced Path

Download Full-text

Efficient test generation algorithm for path delay faults

Electronics Letters ◽

10.1049/el:20000043 ◽

2000 ◽

Vol 36 (1) ◽

pp. 13

Author(s):

Myoung-Gyun Kim ◽

Sungho Kang

Keyword(s):

Test Generation ◽

Delay Faults ◽

Path Delay ◽

Path Delay Faults ◽

Generation Algorithm ◽

Efficient Test

Download Full-text

Transition Path Delay Faults: A New Path Delay Fault Model for Small and Large Delay Defects

IEEE Transactions on Very Large Scale Integration (VLSI) Systems ◽

10.1109/tvlsi.2007.909796 ◽

2008 ◽

Vol 16 (1) ◽

pp. 98-107 ◽

Cited By ~ 26

Author(s):

Irith Pomeranz ◽

Sudhakar M. Reddy

Keyword(s):

Fault Model ◽

Delay Faults ◽

Path Delay ◽

Path Delay Faults ◽

Transition Path ◽

Large Delay ◽

Delay Fault ◽

Path Delay Fault ◽

Delay Defects

Download Full-text

Test Generation for Path Delay Faults

Frontiers in Electronic Testing - Delay Fault Testing for VLSI Circuits ◽

10.1007/978-1-4615-5597-1_7 ◽

1998 ◽

pp. 101-130

Author(s):

Angela Krstić ◽

Kwang-Ting Cheng

Keyword(s):

Test Generation ◽

Delay Faults ◽

Path Delay ◽

Path Delay Faults

Download Full-text

Functional test generation for path delay faults

Proceedings of the Fourth Asian Test Symposium ◽

10.1109/ats.1995.485358 ◽

2002 ◽

Cited By ~ 1

Author(s):

M.K. Srinivas ◽

V.D. Agrawal ◽

M.L. Bushnell

Keyword(s):

Test Generation ◽

Functional Test ◽

Delay Faults ◽

Path Delay ◽

Path Delay Faults

Download Full-text