X-Ray Diffractometric Examination of Low-Temperature Phase Transformations in Single-Crystal Strontium Titanate

1964 ◽  
pp. 136-145 ◽  
Author(s):  
Farrel W. Lytle
1963 ◽  
Vol 7 ◽  
pp. 136-145 ◽  
Author(s):  
Farrel W. Lytle

AbstractThe lattice parameters of single-crystal SrTiO2 were determined by X-ray diffraction as a function of temperature from 4.2 to 300°K. Three significant regions were found: from 65 to 110°K a tetragonal modification, exists (c/a = 1.00056); from 35 to 55°K, line splitting consistent with orthorhornbic symmetry was observed, and at 10°K an anomalous maximum in the lattice parameter vs. temperature curve was found which suggested a third structure transformation. In the tetragonal region (at 78°K) the formation of a domain structure was observed with a polarising microscope. The low-temperature X-ray technique and X-ray cryostat are described.


2008 ◽  
Vol 24 (11) ◽  
pp. 1454-1460 ◽  
Author(s):  
M. Iijima ◽  
W.A. Brantley ◽  
W.H. Guo ◽  
W.A.T. Clark ◽  
T. Yuasa ◽  
...  

1983 ◽  
Vol 4 (1) ◽  
pp. 37-45 ◽  
Author(s):  
P. E. Tomaszewski ◽  
K. Łukaszewicz

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