X-Ray Diffractometric Examination of Low-Temperature Phase Transformations in Single-Crystal Strontium Titanate
Keyword(s):
X Ray
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AbstractThe lattice parameters of single-crystal SrTiO2 were determined by X-ray diffraction as a function of temperature from 4.2 to 300°K. Three significant regions were found: from 65 to 110°K a tetragonal modification, exists (c/a = 1.00056); from 35 to 55°K, line splitting consistent with orthorhornbic symmetry was observed, and at 10°K an anomalous maximum in the lattice parameter vs. temperature curve was found which suggested a third structure transformation. In the tetragonal region (at 78°K) the formation of a domain structure was observed with a polarising microscope. The low-temperature X-ray technique and X-ray cryostat are described.
2011 ◽
Vol 79
(5)
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pp. 1179-1186
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Orientational ordering in the low-temperature phase ofC60studied by single-crystal x-ray diffraction
1993 ◽
Vol 48
(23)
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pp. 17619-17621
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Keyword(s):
X Ray
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1990 ◽
Vol 86
(18)
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pp. 3135
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1994 ◽
Vol 9
(11)
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pp. 2809-2813
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