Hull Lecture No 2, High Current Dielectric Breakdown Switching
1984 ◽
pp. 551-554
◽
1987 ◽
Vol 42
(8)
◽
pp. 959-972
◽
1974 ◽
Vol 32
◽
pp. 544-545
1988 ◽
Vol 46
◽
pp. 474-475
Defect reduction in oxygen implanted silicon-on-insulator material during high-temperature annealing
1989 ◽
Vol 47
◽
pp. 604-605
1979 ◽
Vol 40
(C7)
◽
pp. C7-303-C7-304
1979 ◽
Vol 40
(C7)
◽
pp. C7-281-C7-282
1979 ◽
Vol 129
(9)
◽
pp. 87
◽
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