X-Ray Diffraction of Lipid Model Membranes

Author(s):  
Arwen I. I. Tyler ◽  
Robert V. Law ◽  
John M. Seddon

1990 ◽  
Vol 1024 (2) ◽  
pp. 336-344 ◽  
Author(s):  
Thomas Mavromoustakos ◽  
De-Ping Yang ◽  
Avgui Charalambous ◽  
Leo G. Herbette ◽  
Alexandros Makriyannis


1991 ◽  
Vol 59 (3) ◽  
pp. 645-653 ◽  
Author(s):  
J. Katsaras ◽  
R.H. Stinson ◽  
J.H. Davis ◽  
E.J. Kendall


2007 ◽  
Vol 150 (1) ◽  
pp. 58-65 ◽  
Author(s):  
Leide P. Cavalcanti ◽  
Oleg Konovalov ◽  
Heinrich Haas


2010 ◽  
Vol 98 (3) ◽  
pp. 478a
Author(s):  
Juan C. Gómez-Fernández ◽  
Angel Perez-Lara ◽  
Francisco J. Aranda ◽  
Alessio Ausili ◽  
Ana deGodos ◽  
...  


Data in Brief ◽  
2016 ◽  
Vol 7 ◽  
pp. 981-989
Author(s):  
Victoria Gómez-Murcia ◽  
Alejandro Torrecillas ◽  
Ana M. deGodos ◽  
Senena Corbalán-García ◽  
Juan C. Gómez-Fernández


2011 ◽  
Vol 100 (3) ◽  
pp. 625a
Author(s):  
Kathleen D. Cao ◽  
Luka Pocivavsek ◽  
Niels Holten-Andersen ◽  
Stephanie A. Harmon ◽  
Mati Meron ◽  
...  


Author(s):  
R. E. Herfert

Studies of the nature of a surface, either metallic or nonmetallic, in the past, have been limited to the instrumentation available for these measurements. In the past, optical microscopy, replica transmission electron microscopy, electron or X-ray diffraction and optical or X-ray spectroscopy have provided the means of surface characterization. Actually, some of these techniques are not purely surface; the depth of penetration may be a few thousands of an inch. Within the last five years, instrumentation has been made available which now makes it practical for use to study the outer few 100A of layers and characterize it completely from a chemical, physical, and crystallographic standpoint. The scanning electron microscope (SEM) provides a means of viewing the surface of a material in situ to magnifications as high as 250,000X.



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