scholarly journals Fault Analysis in Analog Circuits Through Language Manipulation and Abstraction

2018 ◽  
pp. 89-105
Author(s):  
Enrico Fraccaroli ◽  
Francesco Stefanni ◽  
Franco Fummi ◽  
Mark Zwolinski
Keyword(s):  
Analog Circuits ◽  
Fault Analysis

Efficient Fault Analysis in Linear Analog Circuits.

1979 ◽  
Author(s):  
Alfred T. Johnson ◽  
Jr
Keyword(s):  
Analog Circuits ◽  
Fault Analysis ◽  
Linear Analog

scholarly journals Fault analysis in analog circuits through language manipulation and abstraction

2017 ◽  
Author(s):  
Enrico Fraccaroli ◽  
Francesco Stefanni ◽  
Franco Fummi ◽  
Mark Zwolinski
Keyword(s):  
Analog Circuits ◽  
Fault Analysis

Synthesis of Network Functions for the Discrete-Analog Circuits with Switched Capacitors

2017 ◽  
pp. 47-53
Author(s):  
Konstantin Sergeyevich GORSHKOV ◽  
◽  
Sergei Aleksandrovich KURGANOV ◽  
Vladimir Valentinovich FILARETOV ◽  
◽  
...  
Keyword(s):  
Analog Circuits ◽  
Discrete Analog ◽  
Switched Capacitors ◽  
Network Functions

Fault Analysis of A Five-Phase Induction Motor Drive

2008 ◽  
Vol 1 (3) ◽  
pp. 36-44
Author(s):  
M. Rizwan Khan ◽  
Atif Iqbal ◽  
Mukhtar Ahmad
Keyword(s):  
Induction Motor ◽  
Fault Analysis ◽  
Motor Drive ◽  
Induction Motor Drive

Analog Circuit Failure Analysis Using Time-Resolved Emission

2005 ◽  
Author(s):  
B.J. Cain ◽  
G.L. Woods ◽  
A. Syed ◽  
R. Herlein ◽  
Toshihiro Nomura
Keyword(s):  
Analog Circuits ◽  
Integrated Circuit ◽  
Analog Circuit ◽  
Photon Emission ◽  
Nonlinear Process ◽  
Time Resolved ◽  
Non Invasive ◽  
Highly Nonlinear ◽  
Excellent Spatial Resolution ◽  
5 Ghz

Abstract Time-Resolved Emission (TRE) is a popular technique for non-invasive acquisition of time-domain waveforms from active nodes through the backside of an integrated circuit. [1] State-of-the art TRE systems offer high bandwidths (> 5 GHz), excellent spatial resolution (0.25um), and complete visibility of all nodes on the chip. TRE waveforms are typically used for detecting incorrect signal levels, race conditions, and/or timing faults with resolution of a few ps. However, extracting the exact voltage behavior from a TRE waveform is usually difficult because dynamic photon emission is a highly nonlinear process. This has limited the perceived utility of TRE in diagnosing analog circuits. In this paper, we demonstrate extraction of voltage waveforms in passing and failing conditions from a small-swing, differential logic circuit. The voltage waveforms obtained were crucial in corroborating a theory for some failures inside an 0.18um ASIC.

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