Atomistic Modelling and Simulation of Transmission Electron Microscopy Images: Application to Intrinsic Defects of Graphene

Author(s):  
Cyril Guedj ◽  
Léonard Jaillet ◽  
François Rousse ◽  
Stéphane Redon
2011 ◽  
Vol 245 (2) ◽  
pp. 140-147 ◽  
Author(s):  
G. KYLBERG ◽  
M. UPPSTRÖM ◽  
K.-O. HEDLUND ◽  
G. BORGEFORS ◽  
I.-M. SINTORN

2008 ◽  
Vol 112 (6) ◽  
pp. 1759-1763 ◽  
Author(s):  
Norihiko L. Okamoto ◽  
Bryan W. Reed ◽  
Shareghe Mehraeen ◽  
Apoorva Kulkarni ◽  
David Gene Morgan ◽  
...  

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