Safe Evolution of Product Lines Using Configuration Knowledge Laws

2020 ◽  
pp. 210-227
Author(s):  
Leopoldo Teixeira ◽  
Rohit Gheyi ◽  
Paulo Borba
Keyword(s):  
Product Lines

Transmission Electron Microscopy and Scanning Capacitance Microscopy Analysis of Dislocation-Induced Leakages in n-channel I/O Transistors

2005 ◽  
Author(s):  
M.L. Anderson ◽  
P. Tangyunyong ◽  
T.A. Hill ◽  
C.Y. Nakakura ◽  
T.J. Headley ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
New Product Development ◽  
Yield Enhancement ◽  
Product Development Process ◽  
Product Lines ◽  
Scanning Capacitance Microscopy ◽  
Transmission Electron ◽  
Complementary Techniques ◽  
Analytical Tools

Abstract By combining transmission electron microscopy (TEM) [1] with scanning capacitance microscopy (SCM) [2], it is possible to enhance our understanding of device failures. At Sandia, these complementary techniques have been utilized for failure analysis in new product development, process validation, and yield enhancement, providing unique information that cannot be obtained with other analytical tools. We have previously used these instruments to identify the root causes of several yield-limiting defects in CMOS device product lines [3]. In this paper, we describe in detail the use of these techniques to identify electrically active silicon dislocations in failed SRAMs and to study the underlying leakage mechanisms associated with these defects.

Delivering Savings with Open Architecture and Product Lines

2011 ◽  
Author(s):  
Brian Womble ◽  
William Schmidt ◽  
Mike Arendt ◽  
Tim Fain
Keyword(s):  
Open Architecture ◽  
Product Lines

scholarly journals Language Family Engineering with Product Lines of Multi-level Models

2021 ◽  
Author(s):  
Juan de Lara ◽  
Esther Guerra
Keyword(s):  
Software Engineering ◽  
Arbitrary Number ◽  
Formal Theory ◽  
The Other ◽  
Language Family ◽  
Top Down ◽  
Product Lines ◽  
Modelling Languages ◽  
Multi Level ◽  
Definition Of

AbstractModelling is an essential activity in software engineering. It typically involves two meta-levels: one includes meta-models that describe modelling languages, and the other contains models built by instantiating those meta-models. Multi-level modelling generalizes this approach by allowing models to span an arbitrary number of meta-levels. A scenario that profits from multi-level modelling is the definition of language families that can be specialized (e.g., for different domains) by successive refinements at subsequent meta-levels, hence promoting language reuse. This enables an open set of variability options given by all possible specializations of the language family. However, multi-level modelling lacks the ability to express closed variability regarding the availability of language primitives or the possibility to opt between alternative primitive realizations. This limits the reuse opportunities of a language family. To improve this situation, we propose a novel combination of product lines with multi-level modelling to cover both open and closed variability. Our proposal is backed by a formal theory that guarantees correctness, enables top-down and bottom-up language variability design, and is implemented atop the MetaDepth multi-level modelling tool.

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