scholarly journals Probabilistic Verification for Reliability of a Two-by-Two Network-on-Chip System

2021 ◽  
pp. 232-248
Author(s):  
Riley Roberts ◽  
Benjamin Lewis ◽  
Arnd Hartmanns ◽  
Prabal Basu ◽  
Sanghamitra Roy ◽  
...  
Author(s):  
Benjamin Lewis ◽  
Arnd Hartmanns ◽  
Prabal Basu ◽  
Rajesh Jayashankara Shridevi ◽  
Koushik Chakraborty ◽  
...  

2014 ◽  
Vol 35 (2) ◽  
pp. 341-346
Author(s):  
Xiao-fu Zheng ◽  
Hua-xi Gu ◽  
Yin-tang Yang ◽  
Zhong-fan Huang

IEEE Access ◽  
2021 ◽  
pp. 1-1
Author(s):  
Quoc-Tuan Vien ◽  
Michael Opoku Agyeman ◽  
Mallik Tatipamula ◽  
Huan X. Nguyen

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