Doping Concentration Dependence of Pinch-Off Effect in Inhomogeneous Schottky Diodes

Author(s):  
Subhash Chand ◽  
Priyanka Kaushal
2009 ◽  
Vol 615-617 ◽  
pp. 857-860
Author(s):  
Donatella Puglisi ◽  
Gaetano Foti ◽  
Giuseppe Bertuccio

The achievement of nuclear detectors in Silicon Carbide imposes severe constraints on the electronic quality and thickness of the material due to the relatively high value of the energy required to generate an electron-hole pair (7.8 eV) in this material compared to the value for Si (3.6 eV). In this work, 4H-SiC charged particle detectors were realised using epitaxial layers of n-type doping as active region. The thickness of the epilayer is always below 80 μm with a net doping concentration in the range of 8 x 1013 to 1016 cm-3. These properties allowed the fabrication of Schottky diodes that operate well as radiation detectors. At low doping concentration, the epilayer is totally depleted at quite low reverse bias (≈ 50 V), thereby obtaining the maximum active volume.


2019 ◽  
Vol 323 ◽  
pp. 134778
Author(s):  
Shojan P. Pavunny ◽  
Rachael L. Myers-Ward ◽  
Kevin M. Daniels ◽  
Wendy Shi ◽  
Karthik Sridhara ◽  
...  

2014 ◽  
Vol 64 (3) ◽  
pp. 443-450
Author(s):  
Yeon-Ho Kil ◽  
Hyeon Deok Yang ◽  
Jong-Han Yang ◽  
Sukill Kang ◽  
Tae Soo Jeong ◽  
...  

2016 ◽  
Vol 108 (18) ◽  
pp. 182106 ◽  
Author(s):  
Shermin Arab ◽  
Maoqing Yao ◽  
Chongwu Zhou ◽  
P. Daniel Dapkus ◽  
Stephen B. Cronin

2014 ◽  
Vol 9 (1) ◽  
pp. 673 ◽  
Author(s):  
Li-Ting Tseng ◽  
Xi Luo ◽  
Thiam Tan ◽  
Sean Li ◽  
Jiabao Yi

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