High-dimensional large sample data sets, between feature variables and between samples, may cause some correlative or repetitive factors, occupy lots of storage space, and consume much computing time. Using the Elman neural network to deal with them, too many inputs will influence the operating efficiency and recognition accuracy; too many simultaneous training samples, as well as being not able to get precise neural network model, also restrict the recognition accuracy. Aiming at these series of problems, we introduce the partial least squares (PLS) and cluster analysis (CA) into Elman neural network algorithm, by the PLS for dimension reduction which can eliminate the correlative and repetitive factors of the features. Using CA eliminates the correlative and repetitive factors of the sample. If some subclass becomes small sample, with high-dimensional feature and fewer numbers, PLS shows a unique advantage. Each subclass is regarded as one training sample to train the different precise neural network models. Then simulation samples are discriminated and classified into different subclasses, using the corresponding neural network to recognize it. An optimized Elman neural network classification algorithm based on PLS and CA (PLS-CA-Elman algorithm) is established. The new algorithm aims at improving the operating efficiency and recognition accuracy. By the case analysis, the new algorithm has unique superiority, worthy of further promotion.
Grade Prediction Model Based on DeepCycle Neural Network Classification Algorithm
