Photographic astrometry, including work with Schmidt telescopes, can be divided into two main fields, (i) the measurement of positions of objects relative to a reference frame of stars with known celestial coordinates, and (ii) the measurement of relative proper motions and trigonometric parallaxes from a series of plates taken on the same field. The former demands a knowledge of the absolute transformation between angles on the sky and measurements on a plate, whereas in the latter we are only interested in differential transformations from plate to plate. The potential value of Schmidt telescopes for both these fields of astrometry lies in the large area of sky and range of magnitude which can be imaged on a single plate. The former advantage is however, to some extent offset by the curvature of the focal surface which means that, in order to utilize the full field the plates must be constrained to the form of the focal surface during exposure.
Full-field thickness measurement of ultrathin liquid film in receding contact-induced nano-channel using surface plasmon resonance
