Feature Location Through the Combination of Run-Time Architecture Models and Information Retrieval

2016 ◽  
pp. 180-195 ◽  
Author(s):  
Lorena Arcega ◽  
Jaime Font ◽  
Øystein Haugen ◽  
Carlos Cetina
Keyword(s):  
Information Retrieval ◽  
Feature Location ◽  
Run Time

Feature Location Using Probabilistic Ranking of Methods Based on Execution Scenarios and Information Retrieval

2007 ◽  
Vol 33 (6) ◽  
pp. 420-432 ◽  
Author(s):  
Denys Poshyvanyk ◽  
Yann-Gael Gueheneuc ◽  
Andrian Marcus ◽  
Giuliano Antoniol ◽  
Vaclav Rajlich
Keyword(s):  
Information Retrieval ◽  
Feature Location

On the Influence of Models at Run-Time Traces in Dynamic Feature Location

2017 ◽  
pp. 90-105 ◽  
Author(s):  
Lorena Arcega ◽  
Jaime Font ◽  
Øystein Haugen ◽  
Carlos Cetina
Keyword(s):  
Dynamic Feature ◽  
Feature Location ◽  
Run Time

scholarly journals Feature Location in Source Code by Trace-Based Impact Analysis and Information Retrieval

2012 ◽  
Vol E95-D (1) ◽  
pp. 205-214
Author(s):  
Zhengong CAI ◽  
Xiaohu YANG ◽  
Xinyu WANG ◽  
Aleksander J. KAVS
Keyword(s):  
Information Retrieval ◽  
Impact Analysis ◽  
Source Code ◽  
Feature Location

Demonstration of the Use of Tape-Recorded Information from a High Vacuum Electron Microscope

1969 ◽  
Vol 27 ◽  
pp. 218-219
Author(s):  
Richard E. Hartman ◽  
Roberta S. Hartman ◽  
Peter L. Ramos
Keyword(s):  
Information Retrieval ◽  
Electron Microscope ◽  
Magnetic Tape ◽  
High Vacuum ◽  
Data Retrieval ◽  
Electronic Information ◽  
Electronic Data ◽  
Subsequent Processing ◽  
Continuous Record

We have long felt that some form of electronic information retrieval would be more desirable than conventional photographic methods in a high vacuum electron microscope for various reasons. The most obvious of these is the fact that with electronic data retrieval the major source of gas load is removed from the instrument. An equally important reason is that if any subsequent analysis of the data is to be made, a continuous record on magnetic tape gives a much larger quantity of data and gives it in a form far more satisfactory for subsequent processing.

Stain contamination and embedding in electron microscopy

1986 ◽  
Vol 44 ◽  
pp. 50-53
Author(s):  
Hilton H. Mollenhauer
Keyword(s):  
Electron Microscopy ◽  
Information Retrieval ◽  
Epoxy Resins ◽  
Image Contrast ◽  
Sample Preservation ◽  
Factors Associated ◽  
Amount Of Information ◽  
Electron Microscopical ◽  
Contrast Information

Many factors (e.g., resolution of microscope, type of tissue, and preparation of sample) affect electron microscopical images and alter the amount of information that can be retrieved from a specimen. Of interest in this report are those factors associated with the evaluation of epoxy embedded tissues. In this context, informational retrieval is dependant, in part, on the ability to “see” sample detail (e.g., contrast) and, in part, on tue quality of sample preservation. Two aspects of this problem will be discussed: 1) epoxy resins and their effect on image contrast, information retrieval, and sample preservation; and 2) the interaction between some stains commonly used for enhancing contrast and information retrieval.

Information and Dose in the Scanning Transmission Ion Microscope

1980 ◽  
Vol 38 ◽  
pp. 232-233
Author(s):  
Fox T. R. ◽  
R. Levi-Setti
Keyword(s):  
Information Retrieval ◽  
Electron Microscope ◽  
Elastic Scattering ◽  
Energy Loss ◽  
Cross Sections ◽  
Previous Analysis ◽  
Single Scattering ◽  
Screening Length ◽  
Relative Damage ◽  
Scanning Transmission

At an earlier meeting [1], we discussed information retrieval in the scanning transmission ion microscope (STIM) compared with the electron microscope at the same energy. We treated elastic scattering contrast, using total elastic cross sections; relative damage was estimated from energy loss data. This treatment is valid for “thin” specimens, where the incident particles suffer only single scattering. Since proton cross sections exceed electron cross sections, a given specimen (e.g., 1 μg/cm2 of carbon at 25 keV) may be thin for electrons but “thick” for protons. Therefore, we now extend our previous analysis to include multiple scattering. Our proton results are based on the calculations of Sigmund and Winterbon [2], for 25 keV protons on carbon, using a Thomas-Fermi screened potential with a screening length of 0.0226 nm. The electron results are from Crewe and Groves [3] at 30 keV.

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