High Resolution Time Domain Reflectometry for Dielectric State Monitoring in High Voltage Cables

Lecture Notes in Electrical Engineering - Applications in Electronics Pervading Industry, Environment and Society ◽

10.1007/978-3-319-55071-8_13 ◽

2017 ◽

pp. 104-110

Author(s):

Gaetano Randazzo ◽

Antonio Di Stefano ◽

G. Costantino Giaconia

Keyword(s):

High Resolution ◽

High Voltage ◽

Time Domain ◽

Time Domain Reflectometry ◽

Resolution Time ◽

State Monitoring ◽

Dielectric State

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Determining velocity of detonation using high-resolution time domain reflectometry

Review of Scientific Instruments ◽

10.1063/1.5100750 ◽

2019 ◽

Vol 90 (8) ◽

pp. 085005

Author(s):

P. Rae

Keyword(s):

High Resolution ◽

Time Domain ◽

Time Domain Reflectometry ◽

Resolution Time ◽

Velocity Of Detonation

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HIGH-RESOLUTION TIME DOMAIN REFLECTOMETRY

Soil Science ◽

10.1097/00010694-199515930-00001 ◽

1995 ◽

Vol 159 (3) ◽

pp. 149-154 ◽

Author(s):

L. W. PETERSEN ◽

A. THOMSEN ◽

P. MOLDRUP ◽

O. H. JACOBSEN ◽

D. E. ROLSTON

Keyword(s):

High Resolution ◽

Time Domain ◽

Time Domain Reflectometry ◽

Resolution Time

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A novel approach for the design of a modified excitation signal using a narrow pulse generator for high-resolution time-domain reflectometry applications

Microwave and Optical Technology Letters ◽

10.1002/mop.28759 ◽

2014 ◽

Vol 56 (12) ◽

pp. 2987-2990 ◽

Author(s):

Mohammad Ojaroudi ◽

Esafndiar Mehrshahi ◽

Aly. E. Fathy

Keyword(s):

High Resolution ◽

Time Domain ◽

Pulse Generator ◽

Time Domain Reflectometry ◽

Resolution Time ◽

Excitation Signal ◽

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Open-short Normalization Method for a Quick Defect Identification in Branched Traces with High-resolution Time-domain Reflectometry

10.1109/itc50571.2021.00032 ◽

2021 ◽

Author(s):

Yang Shang ◽

Makoto Shinohara ◽

Eiji Kato ◽

Masaichi Hashimoto ◽

Joanna Kiljan

Keyword(s):

High Resolution ◽

Time Domain ◽

Time Domain Reflectometry ◽

Normalization Method ◽

Resolution Time ◽

Defect Identification

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2.5D Package Modelling for Short Circuit Failure Analysis by High-Resolution Time-domain Reflectometry

2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) ◽

10.1109/ipfa.2018.8452607 ◽

2018 ◽

Author(s):

Yang Shang ◽

Makoto Shinohara ◽

Wen Qiu ◽

Bernice Zee

Keyword(s):

High Resolution ◽

Failure Analysis ◽

Time Domain ◽

Short Circuit ◽

Time Domain Reflectometry ◽

Resolution Time

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2.5D chip TSV open failure analysis by high resolution time-domain reflectometry

2017 IEEE 19th Electronics Packaging Technology Conference (EPTC) ◽

10.1109/eptc.2017.8277467 ◽

2017 ◽

Author(s):

Masaichi Hashimoto ◽

Makoto Shinohara ◽

Yang Shang ◽

Aparna Mohan ◽

Bernice Zee

Keyword(s):

High Resolution ◽

Failure Analysis ◽

Time Domain ◽

Time Domain Reflectometry ◽

Resolution Time

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High resolution time domain reflectometry and coaxial cable for soil nail monitoring

Journal of Physics Conference Series ◽

10.1088/1742-6596/1349/1/012149 ◽

2019 ◽

Vol 1349 ◽

pp. 012149

Author(s):

W K Ng ◽

Y Ashaari ◽

M Y Norshazrul

Keyword(s):

High Resolution ◽

Time Domain ◽

Time Domain Reflectometry ◽

Coaxial Cable ◽

Resolution Time ◽

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High-Resolution Time Domain Reflectometry Coil Probe for Measuring Soil Water Content

Soil Science Society of America Journal ◽

10.2136/sssaj1998.03615995006200050008x ◽

1998 ◽

Vol 62 (5) ◽

pp. 1203-1211 ◽

Author(s):

H. H. Nissen ◽

P. Moldrup ◽

K. Henriksen

Keyword(s):

High Resolution ◽

Water Content ◽

Soil Water Content ◽

Time Domain ◽

Time Domain Reflectometry ◽

Resolution Time

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High-resolution Time-domain Reflectometry Analysis in Back-end-of-line (BEOL) by Recursive Circuit Modelling

2018 IEEE 20th Electronics Packaging Technology Conference (EPTC) ◽

10.1109/eptc.2018.8654424 ◽

2018 ◽

Author(s):

Yang Shang ◽

Makoto Shinohara ◽

Rahul Babu Radhamony ◽

Joanna Kiljan ◽

Alan Wu

Keyword(s):

High Resolution ◽

Time Domain ◽

Time Domain Reflectometry ◽

Resolution Time ◽

Circuit Modelling

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Low-cost high-resolution time-domain reflectometry for monitoring the range of reflective points

Journal of Lightwave Technology ◽

10.1109/50.400686 ◽

1995 ◽

Vol 13 (7) ◽

pp. 1282-1288 ◽

Author(s):

H. Geiger ◽

J.P. Dakin

Keyword(s):

High Resolution ◽

Time Domain ◽

Low Cost ◽

Time Domain Reflectometry ◽

Resolution Time

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