GaN, hexagonal modification: diffusion coefficient, diffusion length

Author(s):  
B.K. Meyer
2010 ◽  
Vol 654-656 ◽  
pp. 1355-1358 ◽  
Author(s):  
Nan Wang ◽  
Xiao Wang ◽  
Wen Jing Yao

The diffusion coefficient D decides the diffusion length of solute boundary and plays a key role in the microstructure selection. This paper examines quantitatively the contribution of diffusion coefficient to the eutectic instability and amorphorization ability. The maximum growth velocity Vmax and the maximum undercooling Tmax as functions of activation energy Q in strong liquids are deduced theoretically based on eutectic growth model by separating Q from D. It reveals that the larger the Q, the smaller the Tmax and Vmax, which shows the same tendency as experimental values in some Al-based alloys and glass formers. This indicates that it is the sluggish movement of atoms that makes the transition from eutectic to others structural morphologies, even to amorphous phase, occur at smaller interface growth velocity or undercooling, which is the main contribution of the diffusion coefficient to the amorphorization ability.


2015 ◽  
Vol 3 (6) ◽  
pp. 1243-1249 ◽  
Author(s):  
Angy L. Ortiz ◽  
Graham S. Collier ◽  
Dawn M. Marin ◽  
Jennifer A. Kassel ◽  
Reynolds J. Ivins ◽  
...  

The exciton diffusion coefficient (D) and exciton diffusion length (LD) for three tetrakis(4-carbomethoxyphenyl)porphyrins were obtained by fitting the quenching efficiency and PL lifetime to a 3D exciton Monte Carlo ediffusion model.


1984 ◽  
Vol 36 ◽  
Author(s):  
S. P. Tobin ◽  
A. C. Greenwald ◽  
R. G. Wolfson ◽  
D. L. Meier ◽  
P. J. Drevinsky

ABSTRACTMolybdenum contamination has been detected in silicon epitaxial layers and substrate wafers after processing in any one of several epitaxial silicon reactors. Greatly reduced minority carrier diffusion lengths and lifetimes are consistent with Mo concentrations measured by DLTS in the 1012 and 1013 cm−3 ranges. Depth profiling of diffusion length and the Mo deep level show much greater penetration than expected from previous reports of Mo as a slow diffuser. The data indicate a lower limit of 10−8 cm2/sec for the diffusion coefficient of Mo in silicon at 1200°C, consistent with high diffusivities measured for other transition metals.


2013 ◽  
Vol 2013 ◽  
pp. 1-7 ◽  
Author(s):  
En Mei Jin ◽  
Kyung-Hee Park ◽  
Ju-Young Park ◽  
Jae-Wook Lee ◽  
Soon-Ho Yim ◽  
...  

A chitosan binder-based TiO2photoelectrode is used in dye-sensitized solar cells (DSSCs). Field-emission scanning electron microscope (FE-SEM) images revealed that the grain size, thickness, and distribution of TiO2films are affected by the chitosan content. With addition of 2.0 wt% chitosan to the TiO2film (D2), the surface pore size became the smallest, and the pores were fairly evenly distributed. The electron transit time, electron recombination lifetime, diffusion coefficient, and diffusion length were analyzed by IMVS and IMPS. The best DSSC, with 2.0 wt% chitosan addition to the TiO2film, had a shorter electron transit time, longer electron recombination lifetime, and larger diffusion coefficient and diffusion length than the other samples. The results of 2.0 wt% chitosan-added TiO2DSSCs are an electron transit time of  s, electron recombination lifetime of  s, diffusion coefficient of  cm2s−1, diffusion length of 14.81 μm, and a solar conversion efficiency of 4.18%.


2020 ◽  
Vol 128 (11) ◽  
pp. 115103
Author(s):  
Patrik Ščajev ◽  
Vaiva Soriūtė ◽  
Gediminas Kreiza ◽  
Tadas Malinauskas ◽  
Sandra Stanionytė ◽  
...  

2020 ◽  
Vol 8 (30) ◽  
pp. 10290-10301 ◽  
Author(s):  
Patrik Ščajev ◽  
Saulius Miasojedovas ◽  
Saulius Juršėnas

Recombination, diffusion rates and diffusion length in MAPbI3 and MAPBr3 crystals in a wide carrier density range: experiment and theory.


2009 ◽  
Vol 83 (8) ◽  
pp. 1171-1175 ◽  
Author(s):  
A. K. Narula ◽  
S. K. Goyal ◽  
Savita Saini ◽  
R. P. Chauhan ◽  
S. K. Chakarvarti

2014 ◽  
Vol 7 (3) ◽  
pp. 1148-1158 ◽  
Author(s):  
Jeffrey A. Christians ◽  
David T. Leighton ◽  
Prashant V. Kamat

The hole diffusion coefficient and diffusion length in Sb2S3 is measured. Hole transfer from Sb2S3 to CuSCN is found to be predominately limited by transfer across the Sb2S3–CuSCN interface.


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