Electron Probe Microanalysis of Oxygen and Determination of Oxide Film Thickness Using Gaussian Ф(ρz) Curves

1985 ◽  
pp. 299-308 ◽  
Author(s):  
P. Willich ◽  
D. Obertop
Keyword(s):  
Oxide Film ◽  
Film Thickness ◽  
Electron Probe Microanalysis ◽  
Electron Probe ◽  
Oxide Film Thickness

Determination of Oxide Film Thickness by Proton Activation

1961 ◽  
Vol 33 (4) ◽  
pp. 583-586 ◽  
Author(s):  
B. A. Thompson
Keyword(s):  
Oxide Film ◽  
Film Thickness ◽  
Proton Activation ◽  
Oxide Film Thickness

Determination of the Oxide Film Thickness on Tin

Nature ◽  
1956 ◽  
Vol 178 (4530) ◽  
pp. 434-435 ◽  
Author(s):  
F. W. SALT ◽  
J. G. N. THOMAS
Keyword(s):  
Oxide Film ◽  
Film Thickness ◽  
Oxide Film Thickness

Determination of anodic oxide film thickness by a luminescence method

1982 ◽  
Vol 11-12 ◽  
pp. 90-99 ◽  
Author(s):  
Lj.D. Zeković ◽  
V.V. Urošević ◽  
B. Jovanić
Keyword(s):  
Oxide Film ◽  
Film Thickness ◽  
Anodic Oxide ◽  
Anodic Oxide Film ◽  
Luminescence Method ◽  
Oxide Film Thickness

Electron Probe Measurements of Oxide Film Thickness on Silicon Surfaces

2015 ◽  
Vol 58 (9) ◽  
pp. 953-957 ◽  
Author(s):  
V. P. Gavrilenko ◽  
A. Yu. Kuzin ◽  
V. B. Mityukhlyaev ◽  
M. A. Stepovich ◽  
P. A. Todua ◽  
...  
Keyword(s):  
Oxide Film ◽  
Film Thickness ◽  
Electron Probe ◽  
Silicon Surfaces ◽  
Oxide Film Thickness ◽  
Probe Measurements

scholarly journals Photoluminescence of ion-synthesized 9R-Si inclusions in SiO2/Si structure: Effect of irradiation dose and oxide film thickness

2021 ◽  
Vol 118 (21) ◽  
pp. 212101
Author(s):  
Alena Nikolskaya ◽  
Alexey Belov ◽  
Alexey Mikhaylov ◽  
Anton Konakov ◽  
David Tetelbaum ◽  
...  
Keyword(s):  
Oxide Film ◽  
Film Thickness ◽  
Irradiation Dose ◽  
Structure Effect ◽  
Oxide Film Thickness
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