Progress in Materials Analysis
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28

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Published By Springer Vienna

9783211819050, 9783709188408

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Surface Analytical Investigation of the Corrosion Behaviour of Ti(Pd) Samples

Progress in Materials Analysis ◽

10.1007/978-3-7091-8840-8_9 ◽

1985 ◽

pp. 113-124

Author(s):

G. Pfennig ◽

H. Moers ◽

H. Klewe-Nebenius ◽

R. Kaufmann ◽

H. J. Ache

Keyword(s):

Corrosion Behaviour ◽

Analytical Investigation

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Analysis of Thin Chromate Layers on Aluminium II. Structure and Composition of No-rinse Conversion Layers

Progress in Materials Analysis ◽

10.1007/978-3-7091-8840-8_8 ◽

1985 ◽

pp. 103-112

Author(s):

H. Puderbach ◽

H. Bubert ◽

A. Quentmeier ◽

R. P. H. Garten ◽

S. Storp

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Comparison of Ion Implantation Profiles Obtained by AES/Sputtering Measurements and Monte Carlo Calculations

Progress in Materials Analysis ◽

10.1007/978-3-7091-8840-8_4 ◽

1985 ◽

pp. 49-69

Author(s):

H. Bubert

Keyword(s):

Monte Carlo ◽

Ion Implantation ◽

Monte Carlo Calculations

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Determination of the Bonding Behaviour of Carbon and Nitrogen in Micro-Alloyed Structural Steels

Progress in Materials Analysis ◽

10.1007/978-3-7091-8840-8_27 ◽

1985 ◽

pp. 363-370

Author(s):

H.-G. Hillenbrand ◽

Paul Schwaab

Keyword(s):

Structural Steels ◽

Carbon And Nitrogen

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Microanalytical Characterization of a Powder Metallurgical Ledeburitic Tool Steel by Transmission Electron Microscopy

Progress in Materials Analysis ◽

10.1007/978-3-7091-8840-8_26 ◽

1985 ◽

pp. 351-361

Author(s):

P. Golob ◽

F. Hofer

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Transmission Electron

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Characterization of Technical Surfaces With a Coupled SEM-EDA-Image Analyzer System

Progress in Materials Analysis ◽

10.1007/978-3-7091-8840-8_25 ◽

1985 ◽

pp. 343-350

Author(s):

E. Wallura ◽

J. Linke ◽

K. Koizlik ◽

H. Nickel

Keyword(s):

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Selection and Qualification Tests of High Temperature Materials by Special Microanalytical Methods

Progress in Materials Analysis ◽

10.1007/978-3-7091-8840-8_17 ◽

1985 ◽

pp. 229-261

Author(s):

Volker Thien

Keyword(s):

High Temperature ◽

High Temperature Materials

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Ion Implantation in the Surface Analysis of Solid Materials

Progress in Materials Analysis ◽

10.1007/978-3-7091-8840-8_3 ◽

1985 ◽

pp. 33-47

Author(s):

W. H. Gries

Keyword(s):

Ion Implantation ◽

Surface Analysis ◽

Solid Materials

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Microfocussed Ion Beams for Surface Analysis and Depth Profiling

Progress in Materials Analysis ◽

10.1007/978-3-7091-8840-8_5 ◽

1985 ◽

pp. 71-78

Author(s):

M. Preuss ◽

D. Kingham

Keyword(s):

Surface Analysis ◽

Depth Profiling ◽

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Neutral Primary Beam Secondary Ion Mass Spectrometry Analysis of Corrosion Phenomena on Glass Surfaces

Progress in Materials Analysis ◽

10.1007/978-3-7091-8840-8_13 ◽

1985 ◽

pp. 163-170

Author(s):

T. Richter ◽

G. H. Frischat ◽

G. Borchardt ◽

S. Scherrer ◽

S. Weber

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Primary Beam ◽

Mass Spectrometry Analysis ◽

Spectrometry Analysis ◽

Ion Mass Spectrometry ◽

Glass Surfaces ◽

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