A Simplified Ion Implantation System for Solar Cell Production

Author(s):  
L. D. Nielsen ◽  
P. Balslev
1996 ◽  
Vol 442 ◽  
Author(s):  
O.V. Astafiev ◽  
V.P. Kalinushkin ◽  
N.V. Abrosimov

AbstractMapping Low Angle Light Scattering method (MLALS) is proposed to study defect structure in materials used for solar cell production. Several types of defects are observed in Czochralski Si1−xGex (0.022<x<0.047) single crystals. Recombination activity of these defects is investigated. The possibility of contactless visualisation of grain boundary recombination in polysilicon is also demonstrated.


Solar Cells ◽  
1988 ◽  
Vol 25 (1) ◽  
pp. 31-37 ◽  
Author(s):  
P.H. Lang

Vacuum ◽  
2009 ◽  
Vol 84 (1) ◽  
pp. 119-122 ◽  
Author(s):  
C. Major ◽  
G. Juhász ◽  
P. Petrik ◽  
Z. Horváth ◽  
O. Polgár ◽  
...  

Author(s):  
Ning Tang ◽  
Xi Xi ◽  
Zhengxin Wang ◽  
Hongqiang Qian ◽  
Feng Gao ◽  
...  

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