Structural Characterization of Amorphous GexSe100-x by Infrared and Raman Spectroscopy
2001 ◽
pp. 25-34
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1988 ◽
Vol 89
(5)
◽
pp. 2704-2711
◽
1993 ◽
Vol 80-81
◽
pp. 1489-1493
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Keyword(s):
Structural characterization of thin films formed or changed on materials by micro Raman spectroscopy
1998 ◽
Vol 361
(6-7)
◽
pp. 619-620
◽
Keyword(s):
1976 ◽
Vol 32
(3)
◽
pp. 511-518
◽
Keyword(s):