Structural characterization of thin films formed or changed on materials by micro Raman spectroscopy

1998 ◽  
Vol 361 (6-7) ◽  
pp. 619-620 ◽  
Author(s):  
K. Witke ◽  
Klaus-Werner Brzezinka ◽  
Peter Reich
Keyword(s):  
Thin Films ◽  
Raman Spectroscopy ◽  
Structural Characterization ◽  
Micro Raman Spectroscopy

Optical Characterization of C60 Organic Semiconductor and Bilayers

1997 ◽  
Vol 488 ◽  
Author(s):  
J. P. Rainho ◽  
L. Santos ◽  
A. A. Kharlamov
Keyword(s):  
Thin Films ◽  
Raman Spectroscopy ◽  
Optical Absorption ◽  
Film Thickness ◽  
Organic Semiconductor ◽  
Optical Characterization ◽  
Organic Dye ◽  
Zinc Phthalocyanine ◽  
Micro Raman Spectroscopy

AbstractPreparation and characterization either by optical absorption, photoluminescence and micro-Raman spectroscopy of individual components as well as bilayers consisting of organic dye semiconductor Zinc Phthalocyanine (ZnPc) and fullerene, C60, thin films are reported. The layers and structures were deposited in vacuum and some fullerene films were also prepared by casting the C60 solution in benzene. The optical absorption and photoluminescence dependencies on film thickness in bilayers C60/ZnPc were observed and may be discussed in a context of interface induced simmetry reduction of C60 molecules.

Structural characterization of a bonded silicon‐on‐insulator layer with voids by micro‐Raman spectroscopy

1994 ◽  
Vol 75 (12) ◽  
pp. 7866-7868 ◽  
Author(s):  
Akira Usami ◽  
Masaya Ichimura ◽  
Takao Wada ◽  
Shun‐ichiro Ishigami
Keyword(s):  
Raman Spectroscopy ◽  
Structural Characterization ◽  
Silicon On Insulator ◽  
Insulator Layer ◽  
Micro Raman Spectroscopy

Characterization of 〈111〉 diamond thin films by micro-Raman spectroscopy

2004 ◽  
Vol 13 (4-8) ◽  
pp. 886-890 ◽  
Author(s):  
M. Mermoux ◽  
A. Tajani ◽  
B. Marcus ◽  
E. Bustarret ◽  
E. Gheeraert ◽  
...  
Keyword(s):  
Thin Films ◽  
Raman Spectroscopy ◽  
Micro Raman Spectroscopy ◽  
Diamond Thin Films

Structural characterization of V2O5–TiO2 thin films deposited by RF sputtering from a titanium target with vanadium insets

2005 ◽  
Vol 109 (1) ◽  
pp. 47-51 ◽  
Author(s):  
I. Alessandri ◽  
E. Comini ◽  
E. Bontempi ◽  
G. Sberveglieri ◽  
L.E. Depero
Keyword(s):  
Thin Films ◽  
Structural Characterization ◽  
Rf Sputtering ◽  
Tio2 Thin Films ◽  
Titanium Target
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