Detection of Human Emotion from Speech—Tools and Techniques

2017 ◽  
pp. 179-186 ◽  
Author(s):  
Abhijit Mohanta ◽  
Uzzal Sharma
Keyword(s):  
Human Emotion ◽  
Tools And Techniques

The Value of Human Emotion

PsycCRITIQUES ◽  
2014 ◽  
Vol 59 (36) ◽  
Author(s):  
Susan Regas ◽  
Sara Moini
Keyword(s):  
Human Emotion

A Review on Big Data Analytics in Business

2018 ◽  
pp. 210-214
Author(s):  
Manbir Sandhu ◽  
Purnima, Anuradha Saini
Keyword(s):  
Big Data ◽  
Big Data Analytics ◽  
Smart Devices ◽  
Data Streaming ◽  
Huge Amount ◽  
Business Units ◽  
Enormous Amount ◽  
Tools And Techniques ◽  
Heath Care ◽  
Data Analytic

Big data is a fast-growing technology that has the scope to mine huge amount of data to be used in various analytic applications. With large amount of data streaming in from a myriad of sources: social media, online transactions and ubiquity of smart devices, Big Data is practically garnering attention across all stakeholders from academics, banking, government, heath care, manufacturing and retail. Big Data refers to an enormous amount of data generated from disparate sources along with data analytic techniques to examine this voluminous data for predictive trends and patterns, to exploit new growth opportunities, to gain insight, to make informed decisions and optimize processes. Data-driven decision making is the essence of business establishments. The explosive growth of data is steering the business units to tap the potential of Big Data to achieve fueling growth and to achieve a cutting edge over their competitors. The overwhelming generation of data brings with it, its share of concerns. This paper discusses the concept of Big Data, its characteristics, the tools and techniques deployed by organizations to harness the power of Big Data and the daunting issues that hinder the adoption of Business Intelligence in Big Data strategies in organizations.

A Comparative Analysis of the Poetics of Anger in John Osborne’s Look Back in Anger and Femi Osofisan’s The Chattering and the Song

2019 ◽  
Keyword(s):  
Comparative Analysis ◽  
Human Emotion ◽  
Fundamental Component ◽  
Look Back ◽  
Point Of Departure ◽  
Desire To Change

Anger is a basic human emotion that has a force for constructive or destructive ends. Its expression in any circumstance can be a trigger for a desire to change a prevailing situation. In all cases, anger is a fundamental component of art. This study examines the use of anger in Osborne’s Look Back in Anger and Osofisan’s The Chattering and the Song. Osborne and Osofisan are two writers who are very anxious to change their societies through their art. In spite of differences in their origin (Osborne was a Briton while Osofisan is a Nigerian), they wrote at a time of certain social and political upheavals in their countries. They also share similar concerns and attitudes towards art. My focus in this paper is on the early plays of Osborne and Osofisan where anger is strongest and where their artistic triumph is most poignant. Working within the formalist approach, the paper reveals that in Osborne and Osofisan, extreme anger is both material and style and is what marks their art out. The reification by the intellect provides a potent instrument for investigating society. Anger becomes the point of departure for their art, it is not mere hysterics but a cerebral one and it is the motivating force for their writings.

Root Cause Analysis for Pin Leakage

2016 ◽  
Author(s):  
Zhigang Song ◽  
Jochonia Nxumalo ◽  
Manuel Villalobos ◽  
Sweta Pendyala
Keyword(s):  
Failure Analysis ◽  
Root Cause Analysis ◽  
Advanced Technology ◽  
Process Step ◽  
Cause Analysis ◽  
Hard Mask ◽  
Technology Node ◽  
Root Cause ◽  
Tools And Techniques

Abstract Pin leakage continues to be on the list of top yield detractors for microelectronics devices. It is simply manifested as elevated current with one pin or several pins during pin continuity test. Although many techniques are capable to globally localize the fault of pin leakage, root cause analysis and identification for it are still very challenging with today’s advanced failure analysis tools and techniques. It is because pin leakage can be caused by any type of defect, at any layer in the device and at any process step. This paper presents a case study to demonstrate how to combine multiple techniques to accurately identify the root cause of a pin leakage issue for a device manufactured using advanced technology node. The root cause was identified as under-etch issue during P+ implantation hard mask opening for ESD protection diode, causing P+ implantation missing, which was responsible for the nearly ohmic type pin leakage.

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