Void nucleation in tensile dead-loading of a composite incompressible nonlinearly elastic sphere

1989 ◽  
Vol 21 (1) ◽  
pp. 61-82 ◽  
Author(s):  
C. O. Horgan ◽  
T. J. Pence
1995 ◽  
Vol 48 (8) ◽  
pp. 471-485 ◽  
Author(s):  
C. O. Horgan ◽  
D. A. Polignone

Cavitation phenomena in nonlinearly elastic solids have been the subject of extensive investigation in recent years. The impetus for much of these theoretical developments has been supplied by pioneering work of Ball in 1982. Ball investigated a class of bifurcation problems for the equations of nonlinear elasticity which model the appearance of a cavity in the interior of an apparently solid homogensous isotropic elastic sphere or cylinder once a critical external tensile load is attained. This model may also be interpreted in terms of the sudden rapid growth of a pre-existing microvoid. In this paper, we briefly summarize some of the main results obtained to date on radially symmetric cavitation, using the bifurcation model. The paper is a review and a comprehensive list of references is given to original work where details of the analyses may be found.


Author(s):  
T. Marieb ◽  
J. C. Bravman ◽  
P. Flinn ◽  
D. Gardner ◽  
M. Madden

Electromigration and stress voiding have been active areas of research in the microelectronics industry for many years. While accelerated testing of these phenomena has been performed for the last 25 years[1-2], only recently has the introduction of high voltage scanning electron microscopy (HVSEM) made possible in situ testing of realistic, passivated, full thickness samples at high resolution.With a combination of in situ HVSEM and post-testing transmission electron microscopy (TEM) , electromigration void nucleation sites in both normal polycrystalline and near-bamboo pure Al were investigated. The effect of the microstructure of the lines on the void motion was also studied.The HVSEM used was a slightly modified JEOL 1200 EX II scanning TEM with a backscatter electron detector placed above the sample[3]. To observe electromigration in situ the sample was heated and the line had current supplied to it to accelerate the voiding process. After testing lines were prepared for TEM by employing the plan-view wedge technique [6].


2021 ◽  
Vol 11 (8) ◽  
pp. 3378
Author(s):  
Jie Chen ◽  
Darby J. Luscher ◽  
Saryu J. Fensin

A void coalescence term was proposed as an addition to the original void nucleation and growth (NAG) model to accurately describe void evolution under dynamic loading. The new model, termed as modified void nucleation and growth model (MNAG model), incorporated analytic equations to explicitly account for the evolution of the void number density and the void volume fraction (damage) during void nucleation, growth, as well as the coalescence stage. The parameters in the MNAG model were fitted to molecular dynamics (MD) shock data for single-crystal and nanocrystalline Ta, and the corresponding nucleation, growth, and coalescence rates were extracted. The results suggested that void nucleation, growth, and coalescence rates were dependent on the orientation as well as grain size. Compared to other models, such as NAG, Cocks–Ashby, Tepla, and Tonks, which were only able to reproduce early or later stage damage evolution, the MNAG model was able to reproduce all stages associated with nucleation, growth, and coalescence. The MNAG model could provide the basis for hydrodynamic simulations to improve the fidelity of the damage nucleation and evolution in 3-D microstructures.


2005 ◽  
Vol 17 (23) ◽  
pp. 3559-3565 ◽  
Author(s):  
E Duval ◽  
L Saviot ◽  
A Mermet ◽  
D B Murray

2004 ◽  
Vol 21 (10) ◽  
pp. 1979-1982 ◽  
Author(s):  
Wu Rui-Xin ◽  
Wang Yao-Jun

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