XRF determination of 17 trace elements in geological samples using an extended Compton scattering correction procedure

1990 ◽  
Vol 9 (1) ◽  
pp. 77-85 ◽  
Author(s):  
Feng Liangyuan ◽  
Bao Huilan ◽  
Li Ruoling ◽  
Zhang Yawen
Keyword(s):  
Trace Elements ◽  
Compton Scattering ◽  
Correction Procedure ◽  
Geological Samples ◽  
Scattering Correction

Theoretical Calculation of Background in X-Ray Spectrometry for the Determination of Some Heavy Trace Elements

1991 ◽  
Vol 35 (B) ◽  
pp. 755-756
Author(s):  
Jean-Jacques Gruffat
Keyword(s):  
Trace Elements ◽  
Theoretical Calculation ◽  
Spectral Distribution ◽  
Geological Samples ◽  
X Ray ◽  
Correct Calculation ◽  
The Continuum

AbstractThe Kulenkampff-Kramers formula giving the spectral distribution of the continuum as a function of wavelength allows a correct calculation of background under the peak. It is only necessary to measure two backgrounds, one on each side of the peak, The true background under the peak is given by multiplying them by adequate coefficients and adding them up. This method has been applied to the determination of low amounts of Ce, La, Ba and Cs in geological samples.

A simple method for the precise determination of ≥ 40 trace elements in geological samples by ICPMS using enriched isotope internal standardisation

1997 ◽  
Vol 134 (4) ◽  
pp. 311-326 ◽  
Author(s):  
S.M. Eggins ◽  
J.D. Woodhead ◽  
L.P.J. Kinsley ◽  
G.E. Mortimer ◽  
P. Sylvester ◽  
...  
Keyword(s):  
Trace Elements ◽  
Precise Determination ◽  
Geological Samples ◽  
Simple Method
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