Combining imaging ellipsometry and grazing incidence small angle X-ray scattering for in situ characterization of polymer nanostructures
2009 ◽
Vol 396
(1)
◽
pp. 139-149
◽
Keyword(s):
X Ray
◽
2005 ◽
Vol 109
(48)
◽
pp. 22780-22790
◽