Surface plasmon resonance of sputtered Ag films: substrate and mass thickness dependence

2004 ◽  
Vol 80 (7) ◽  
pp. 1535-1540 ◽  
Author(s):  
G. Xu ◽  
M. Tazawa ◽  
P. Jin ◽  
S. Nakao
2020 ◽  
Vol 218 (1) ◽  
pp. 2000150
Author(s):  
Chi-Wu Liu ◽  
Chi-Chung Chen ◽  
Yung-Chen Cheng ◽  
Po-Yu Chen ◽  
Wen-Yen Chang ◽  
...  

2017 ◽  
Vol 46 (10) ◽  
pp. 1560-1563 ◽  
Author(s):  
Ichiro Tanabe ◽  
Yoshito Y. Tanaka ◽  
Koji Watari ◽  
Taras Hanulia ◽  
Takeyoshi Goto ◽  
...  

2020 ◽  
pp. 44-49
Author(s):  
I. N. Pavlov

Two optical methods, namely surface plasmon resonance imaging and frustrated total internal reflection, are described in the paper in terms of comparing their sensitivity to change of refractive index of a thin boundary layer of an investigated medium. It is shown that, despite the fact that the theoretically calculated sensitivity is higher for the frustrated total internal reflection method, and the fact that usually in practice the surface plasmon resonance method, on the contrary, is considered more sensitive, under the same experimental conditions both methods show a similar result.


2010 ◽  
Vol 130 (7) ◽  
pp. 269-274 ◽  
Author(s):  
Takeshi Onodera ◽  
Takuzo Shimizu ◽  
Norio Miura ◽  
Kiyoshi Matsumoto ◽  
Kiyoshi Toko

PIERS Online ◽  
2008 ◽  
Vol 4 (7) ◽  
pp. 746-750 ◽  
Author(s):  
Bing-Hung Chen ◽  
Yih-Chau Wang ◽  
Jia-Hng Lin

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