Study of graphitic microstructure formation in diamond bulk by pulsed Bessel beam laser writing

2017 ◽  
Vol 123 (11) ◽  
Author(s):  
S. Kumar ◽  
B. Sotillo ◽  
A. Chiappini ◽  
R. Ramponi ◽  
P. Di Trapani ◽  
...  
Keyword(s):  
Bessel Beam ◽  
Microstructure Formation ◽  
Laser Writing ◽  
Beam Laser

Electrospray Microthruster Based on Bessel-beam Laser-machined Microcapillaries Embedded in Glass

2021 ◽  
Author(s):  
Brian K. Canfield ◽  
Alexander Terekhov ◽  
Trevor M. Moeller ◽  
Lino Costa
Keyword(s):  
Bessel Beam ◽  
Beam Laser

A Bessel beam laser Doppler velocimeter

2009 ◽  
Vol 282 (9) ◽  
pp. 1874-1878 ◽  
Author(s):  
Andreas Voigt ◽  
Sascha Heitkam ◽  
Lars Büttner ◽  
Jürgen Czarske
Keyword(s):  
Bessel Beam ◽  
Laser Doppler ◽  
Laser Doppler Velocimeter ◽  
Beam Laser

scholarly journals Bessel beam laser-scribing of thin film silicon solar cells by ns pulsed laser

2016 ◽  
Vol 11 (1) ◽  
pp. JTST0011-JTST0011
Author(s):  
Duc Hong DOAN ◽  
Ryoichi IIDA ◽  
Byunggi KIM ◽  
Isao SATOH ◽  
Kazuyoshi FUSHINOBU
Keyword(s):  
Thin Film ◽  
Solar Cells ◽  
Bessel Beam ◽  
Pulsed Laser ◽  
Silicon Solar Cells ◽  
Beam Laser ◽  
Laser Scribing ◽  
Thin Film Silicon

Letter Accurate interferometric system to perform the substrate focusing and alignment in laser writing processes

1997 ◽  
Vol 44 (6) ◽  
pp. 1065-1072
Author(s):  
Jose Ramon Salgueiro ◽  
Juan Felix Roman ◽  
Vicente Moreno
Keyword(s):  
Laser Writing ◽  
Writing Processes

Structural and Electrical Characterization of Shaped Beam Laser Recrystallized Polysilicon on Amorphous Substrates

1981 ◽  
Vol 4 ◽  
Author(s):  
T. J. Stultz ◽  
J. F. Gibbons
Keyword(s):  
Grain Size ◽  
Electrical Characterization ◽  
Grain Structure ◽  
Electrical Characteristics ◽  
Shaped Beam ◽  
Beam Laser ◽  
Cw Laser ◽  
Amorphous Substrates ◽  
Circular Beam

ABSTRACTStructural and electrical characterization of laser recrystallized LPCVD silicon films on amorphous substrates using a shaped cw laser beam have been performed. In comparing the results to data obtained using a circular beam, it was found that a significant increase in grain size can be achieved and that the surface morphology of the shaped beam recrystallized material was much smoother. It was also found that whereas circular beam recrystallized material has a random grain structure, shaped beam material is highly oriented with a <100> texture. Finally the electrical characteristics of the recrystallized film were very good when measured in directions parallel to the grain boundaries.

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