Fabrication and characterization of novel transparent conducting oxide N-CNT doped ZnO for photovoltaic applications

2018 ◽  
Vol 124 (2) ◽  
Author(s):  
Anas Benyounes ◽  
Naseem Abbas ◽  
Maryama Hammi ◽  
Younes Ziat ◽  
Amine Slassi ◽  
...  
Optik ◽  
2018 ◽  
Vol 166 ◽  
pp. 317-322 ◽  
Author(s):  
Abdelhamid Bouaine ◽  
Amira Bourebia ◽  
Hassan Guendouz ◽  
Zineb Riane

2020 ◽  
Vol 15 (1) ◽  
pp. 101-107
Author(s):  
M. Karunakaran ◽  
L. Bruno Chandrasekar ◽  
K. Kasirajan ◽  
R. Chandramohan

This paper reported the preparation and characterization of transparent conducting oxide thin films. Undoped and doped ZnO thin films were prepared by SILAR method. The micro-structural and optical properties were investigated. X-ray diffraction patterns revealed that the prepared thin films are polycrystalline in nature and has a hexagonal structure. The micro-structural properties of prepared thin films were calculated and crystallite size tends to changes due to dopant. The texture coefficients have been evaluated and found to be greater than unity revealing high texturing of the film. Undoped and Mn-doped ZnO prefer the orientation of (002) but Ni-doped ZnO and Mn and Ni co-doped ZnO prefers (100) orientation. The transmittance spectra of pure and transition metal-doped films were plotted against UV-Vis-NIR region and found that the transmittance changes with dopant and nature of doping. The optical band gap values were found to be in the range of 3.00–3.39 eV. The optical constants such as extinction coefficient, refractive index, dielectric constant and optical conductivity were examined.


2004 ◽  
Vol 177 (4-5) ◽  
pp. 1480-1487 ◽  
Author(s):  
H.T. Cao ◽  
Z.L. Pei ◽  
J. Gong ◽  
C. Sun ◽  
R.F. Huang ◽  
...  

2018 ◽  
Vol 2 (4) ◽  
Author(s):  
D. Ali ◽  
M. Z. Butt ◽  
C. Coughlan ◽  
D. Caffrey ◽  
I. V. Shvets ◽  
...  

2008 ◽  
Vol 1071 ◽  
Author(s):  
Koji Aizawa

AbstractCharacterization of 700-nm-thick poly(vinylidene fluoride/trifluoroethylene) [P(VDF/TrFE)]/TiO2/Al-doped ZnO (AZO) structures on a glass substrate were investigated. In this study, the sputtered TiO2 films as insulator were used for the reduction of leakage current. The leakage current density of the fabricated Pt/P(VDF/TrFE)/AZO and Pt/P(VDF/TrFE)/170-nm-thick TiO2/AZO structures were approximately 8.7 and 3.9 nA/cm2 at the applied voltage of 10 V, respectively. In the polarization vs. voltage characteristics, the fabricated Pt/P(VDF/TrFE)/TiO2/AZO structures showed hysteresis loops caused by ferroelectric polarization. The remnant polarization (2Pr) and coercive voltage (2Vc) measured from a saturated hysteresis loop at the frequency of 50 Hz were approximately 12 μC/cm2 and 105 V, respectively. These results suggest that the insertion of TiO2 film is available for reducing the gate leakage current without changing the ferroelectric properties.


2007 ◽  
Vol 51 (12) ◽  
pp. 79 ◽  
Author(s):  
Sang Hern LEE ◽  
Young Moon YU ◽  
Tae Hoon KIM ◽  
Se-Young JEONG

2011 ◽  
Vol 32 (2) ◽  
pp. 154-158
Author(s):  
冯秋菊 FENG Qiu-ju ◽  
冯宇 FENG Yu ◽  
梁红伟 LIANG Hong-wei ◽  
王珏 WANG Jue ◽  
陶鹏程 TAO Peng-cheng ◽  
...  

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