Interfacial roughness in a near-critical binary fluid mixture: X-ray reflectivity and near-specular diffuse scattering

1999 ◽  
Vol 10 (1) ◽  
pp. 45-52 ◽  
Author(s):  
B.R. McClain ◽  
M. Yoon ◽  
J.D. Litster ◽  
S.G.J. Mochrie
Keyword(s):  
Diffuse Scattering ◽  
Interfacial Roughness ◽  
Fluid Mixture ◽  
Binary Fluid ◽  
X Ray

X-ray specular reflectivity study of a critical binary fluid mixture

2005 ◽  
Vol 72 (1) ◽  
Author(s):  
L. W. Marschand ◽  
M. Brown ◽  
L. B. Lurio ◽  
B. M. Law ◽  
S. Uran ◽  
...  
Keyword(s):  
Fluid Mixture ◽  
Binary Fluid ◽  
X Ray ◽  
Specular Reflectivity

Critical consolute point in hard-sphere binary mixtures: Effect of the value of the eighth and higher virial coefficients on its location

2010 ◽  
Vol 75 (3) ◽  
pp. 359-369 ◽  
Author(s):  
Mariano López De Haro ◽  
Anatol Malijevský ◽  
Stanislav Labík
Keyword(s):  
Equation Of State ◽  
Binary Mixtures ◽  
Hard Sphere ◽  
Hard Spheres ◽  
Virial Coefficients ◽  
Fluid Mixture ◽  
Binary Fluid ◽  
Virial Series ◽  
Consolute Point ◽  
Critical Constants

Various truncations for the virial series of a binary fluid mixture of additive hard spheres are used to analyze the location of the critical consolute point of this system for different size asymmetries. The effect of uncertainties in the values of the eighth virial coefficients on the resulting critical constants is assessed. It is also shown that a replacement of the exact virial coefficients in lieu of the corresponding coefficients in the virial expansion of the analytical Boublík–Mansoori–Carnahan–Starling–Leland equation of state, which still leads to an analytical equation of state, may lead to a critical consolute point in the system.

scholarly journals Reproducibility of protein x-ray diffuse scattering and potential utility for modeling atomic displacement parameters

2021 ◽  
Vol 8 (4) ◽  
pp. 044701
Author(s):  
Zhen Su ◽  
Medhanjali Dasgupta ◽  
Frédéric Poitevin ◽  
Irimpan I. Mathews ◽  
Henry van den Bedem ◽  
...  
Keyword(s):  
Diffuse Scattering ◽  
Atomic Displacement ◽  
Potential Utility ◽  
X Ray ◽  
Protein X ◽  
Atomic Displacement Parameters

Evolution of Interfacial Roughness Correlations of Fe Au Films Grown on Mgo(001) Substrates

1996 ◽  
Vol 440 ◽  
Author(s):  
P. C. Chow ◽  
R. Paniago ◽  
R. Forrest ◽  
S. C. Moss ◽  
S. S. P. Parkin ◽  
...  
Keyword(s):  
Thin Films ◽  
Diffuse Scattering ◽  
Perfect Match ◽  
Grazing Incidence ◽  
Interface Roughness ◽  
Metallic Structures ◽  
X Ray ◽  
Dimensional Image ◽  
X Ray Scattering ◽  
Image Plate Detector

AbstractThe growth by sputtering of a series of thin films of Fe/Au on MgO(001) substrates was analyzed using Bragg and diffuse X-ray scattering. The Fe (bcc) layer grows rotated by 45° with respect to the MgO – Au(fcc) (001) epitaxial orientation, resulting in an almost perfect match between the two metallic structures. By collecting the X-ray diffuse scattering under grazing incidence using a 2-dimensional image plate detector, we mapped the reciprocal space of these films. We characterized the correlated interface roughness starting with a buffer of Fe in which only three interfaces are present. The propagation of the roughness was subsequently characterized for Fe/Au multilayers with 40 and 100 bilayers. We observe an enlargement of the surface features as a function of time, evidenced by the longer lateral cutoff length measured for thicker films.

Sign in / Sign up

Export Citation Format

Share Document