Measurement and Prediction of the Thermal Conductivity of Fused Quartz in the Range of 5–45 ℃

2021 ◽  
Vol 42 (8) ◽  
Author(s):  
Xin Rui Zhang ◽  
Gang Qiang Kong ◽  
Yong Hui Chen ◽  
Long Chen ◽  
Geng Chen
2020 ◽  
Vol 10 (1) ◽  
Author(s):  
Xin Rui Zhang ◽  
Gang Qiang Kong ◽  
Le Hua Wang ◽  
Xiao Liang Xu

2000 ◽  
Vol 61 (5) ◽  
pp. 779-787 ◽  
Author(s):  
I.M Abdulagatov ◽  
S.N Emirov ◽  
T.A Tsomaeva ◽  
Kh.A Gairbekov ◽  
S.Ya Askerov ◽  
...  

1990 ◽  
Vol 203 ◽  
Author(s):  
L. J. Shaw-Klein ◽  
S. J. Burns ◽  
S. D. Jacobs

ABSTRACTAnomalously low laser damage resistance thresholds have been observed in many thin film systems. Thermal conductivity values well below bulk have been suggested as a possible cause. A series of reactively sputtered AIN films were deposited on fused quartz and sapphire substrates. Their thermal conductivities were measured using the thermal comparator technique. Important factors contributing to the apparently large thermal resistance in the AIN films include film surfaces, small grain size, and high oxygen concentration. Preferred orientation and columnar morphology also affect film conductivity. Film microstructures were observed by transmission electron microscopy, and correlated with measured values of thermal conductivity.


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