Effects of interfacial roughness on the GMR of Ta/Co/Ta multilayers studied by neutron reflectometer

2021 ◽  
Author(s):  
Min Mao ◽  
Juan Shen ◽  
Xinxi Li ◽  
Yan Wang ◽  
Bo Dai ◽  
...  
Keyword(s):  
Interfacial Roughness ◽  
Neutron Reflectometer

scholarly journals Interfacial Roughness Facilitated by Dislocation and a Metal-Fuse Resistor Fabricated Using a Nanomanipulator

2020 ◽  
Vol 12 (21) ◽  
pp. 24442-24449
Author(s):  
Junwei Zhang ◽  
Rongrong Chen ◽  
Xian Li ◽  
Yong Peng ◽  
Hongbin Ma ◽  
...  
Keyword(s):  
Interfacial Roughness

Effects of interfacial roughness on the magnetoresistance of magnetic metallic multilayers

1994 ◽  
Vol 49 (1) ◽  
pp. 368-377 ◽  
Author(s):  
Randolph Q. Hood ◽  
L. M. Falicov ◽  
D. R. Penn
Keyword(s):  
Metallic Multilayers ◽  
Interfacial Roughness

A new pulsed polarized neutron reflectometer, PORE, at KENS

1999 ◽  
Vol 267-268 ◽  
pp. 185-189 ◽  
Author(s):  
Takeda Masayasu ◽  
Endoh Yasuo
Keyword(s):  
Neutron Reflectometer ◽  
Polarized Neutron

Beyond spatial averaging: Simulations of near-field scanning spectroscopy of quantum structures with interfacial roughness

2000 ◽  
Vol 62 (16) ◽  
pp. 11071-11075 ◽  
Author(s):  
Omar Di Stefano ◽  
Salvatore Savasta ◽  
Giovanna Martino ◽  
Raffaello Girlanda
Keyword(s):  
Near Field ◽  
Quantum Structures ◽  
Spatial Averaging ◽  
Interfacial Roughness ◽  
Scanning Spectroscopy ◽  
Near Field Scanning

In situ study of the growth kinetics and interfacial roughness during the first stages of nickel–silicide formation

2006 ◽  
Vol 83 (11-12) ◽  
pp. 2253-2257 ◽  
Author(s):  
L. Ehouarne ◽  
M. Putero ◽  
D. Mangelinck ◽  
F. Nemouchi ◽  
T. Bigault ◽  
...  
Keyword(s):  
Growth Kinetics ◽  
Nickel Silicide ◽  
Silicide Formation ◽  
Interfacial Roughness ◽  
In Situ Study

D50, an innovative ILL prototype for a white beam neutron reflectometer

Neutron News ◽  
2015 ◽  
Vol 26 (3) ◽  
pp. 27-27 ◽  
Author(s):  
J. Segura-Ruiz ◽  
J. Beaucour ◽  
B. Giroud ◽  
D. Atkins ◽  
R. Cubitt
Keyword(s):  
Neutron Reflectometer ◽  
White Beam

Mapping Interfacial Roughness and Composition in Elemental Semiconductor Systems

1993 ◽  
Vol 32-33 ◽  
pp. 615-618
Author(s):  
A. Ourmazd ◽  
P. Schwander ◽  
Christian Kisielowski-Kemmerich ◽  
Michael Seibt ◽  
F.H. Baumann ◽  
...  
Keyword(s):  
Interfacial Roughness ◽  
Elemental Semiconductor

A polarised neutron reflectometer for studying surface magnetism

1988 ◽  
Vol 45 (2) ◽  
pp. 169-174 ◽  
Author(s):  
R. Felici ◽  
J. Penfold ◽  
R. C. Ward ◽  
W. G. Williams
Keyword(s):  
Surface Magnetism ◽  
Neutron Reflectometer
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