In this paper reflection spectra in the near infrared range are calculated for the diffraction grating of Ge-Sb-Te alloy on a silicon-on-insulator waveguide with use of Tauc–Lorentz dispersion model and Matrix Riccati Equation method.
Design and Construction system for recording Finger print by laser, and separted the signal to noise by holographic element, was done. For safety, total reflection lighting ensures hat aser earns an not enter An operators eyes. Holographic diffraction grating was used instead of computer program to contrast images.
We newly proposed transparent conductive oxide with diffraction grating structure as an excitation field of surface plasmon resonance working at near-infrared spectral region. We experimentally demonstrated the excitation of SPR using Sn-doped In2O3 films with micro-meter pitched diffraction grating. In this study, we considered the correlation between the grating pitch and the optical reflection spectra. Reflection spectra showed clear polarization properties in infrared spectral region, and the reflection edge has also correlation with the pitch of grating. From these results, the excitation of SPR grating was successfully demonstrated and the wavelength can be tuned by changing the grating pitch in infrared region.
Quantitative phase imaging in flows with high resolution holographic diffraction grating
