Assessment of trace metal contamination in the core sediment of Ramsar wetland (Kabar Tal), Begusarai, Bihar (India)

Author(s):  
Himanshu Kaushik ◽  
Rashmi Ranjan ◽  
Rakhshan Ahmad ◽  
Alok Kumar ◽  
Prashant ◽  
...  
2018 ◽  
Vol 637-638 ◽  
pp. 803-812 ◽  
Author(s):  
Miguel Ángel Álvarez-Vázquez ◽  
Serafín Jesús González-Prieto ◽  
Ricardo Prego

Author(s):  
Yasunori Goto ◽  
Hiroomi Eguchi ◽  
Masaru Iida

Abstract In the automotive IC using thick-film silicon on insulator (SOI) semiconductor device, if the gettering capability of a SOI wafer is inadequate, electrical characteristics degradation by metal contamination arises and the yield falls. At this time, an automotive IC was made experimentally for evaluation of the gettering capability as one of the purposes. In this IC, one of the output characteristics varied from the standard, therefore failure analysis was performed, which found trace metal elements as one of the causes. By making full use of 3D perspective, it is possible to fabricate a site-specific sample into 0.1 micrometre in thickness without missing a failure point that has very minute quantities of contaminant in a semiconductor device. Using energy dispersive X-ray, it is possible to detect trace metal contamination at levels 1E12 atoms per sq cm. that are conventionally detected only by trace element analysis.


2020 ◽  
Vol 35 ◽  
pp. 101143
Author(s):  
Michele Fernandes ◽  
Estefan Monteiro da Fonseca ◽  
Leonardo da Silva Lima ◽  
Susanna Eleonora Sichel ◽  
Jessica de Freitas Delgado ◽  
...  

2017 ◽  
Vol 51 (8) ◽  
pp. 4173-4181 ◽  
Author(s):  
Robert J. Rossi ◽  
Daniel J. Bain ◽  
Aubrey L. Hillman ◽  
David P. Pompeani ◽  
Matthew S. Finkenbinder ◽  
...  

2007 ◽  
Vol 18 (6) ◽  
pp. 1194-1206 ◽  
Author(s):  
Cassia O. Farias ◽  
Claudia Hamacher ◽  
Angela de Luca R. Wagener ◽  
Reinaldo C. de Campos ◽  
José M. Godoy

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