An X-ray fourier line shape analysis in cold-worked hexagonal titanium base alloys

1998 ◽  
Vol 29 (10) ◽  
pp. 2639-2642 ◽  
Author(s):  
R. Sen ◽  
S. K. Chattopadhyay ◽  
S. K. Chatterjee
Keyword(s):  
Shape Analysis ◽  
Line Shape ◽  
X Ray ◽  
Line Shape Analysis ◽  
Cold Worked

An X-ray Fourier line shape analysis in cold-worked hexagonal zirconium

1974 ◽  
Vol 9 (6) ◽  
pp. 953-960 ◽  
Author(s):  
S. K. Chatterjee ◽  
S. P. Sen Gupta
Keyword(s):  
Shape Analysis ◽  
Line Shape ◽  
X Ray ◽  
Line Shape Analysis ◽  
Cold Worked

An X-ray Fourier line shape analysis in cold-worked hexagonal metals

1975 ◽  
Vol 10 (7) ◽  
pp. 1093-1104 ◽  
Author(s):  
S. K. Chatterjee ◽  
S. P. Sen Gupta
Keyword(s):  
Shape Analysis ◽  
Line Shape ◽  
X Ray ◽  
Line Shape Analysis ◽  
Cold Worked ◽  
Hexagonal Metals

Surface roughness and correlation length determined from x-ray-diffraction line-shape analysis on germanium (111)

1989 ◽  
Vol 40 (5) ◽  
pp. 3480-3482 ◽  
Author(s):  
Q. Shen ◽  
J. M. Blakely ◽  
M. J. Bedzyk ◽  
K. D. Finkelstein
Keyword(s):  
Surface Roughness ◽  
Correlation Length ◽  
Shape Analysis ◽  
Line Shape ◽  
Diffraction Line ◽  
X Ray Diffraction ◽  
X Ray ◽  
Line Shape Analysis

An x-ray Fourier line shape analysis of hexagonal tellurium films II: Vacuum evaporated at low temperature (133 K)

1984 ◽  
Vol 122 (1) ◽  
pp. 73-91 ◽  
Author(s):  
Ela Chatterjee ◽  
S.P. Sen Gupta
Keyword(s):  
Low Temperature ◽  
Shape Analysis ◽  
Line Shape ◽  
X Ray ◽  
Line Shape Analysis

Line shape analysis of high energy X-ray induced Auger- and photoelectron spectra of thin Cu and Ni films

2002 ◽  
Vol 122 (2) ◽  
pp. 103-114 ◽  
Author(s):  
Wolfgang S.M. Werner ◽  
László Kövér ◽  
József Tóth ◽  
Dezsó Varga
Keyword(s):  
Shape Analysis ◽  
Line Shape ◽  
High Energy ◽  
Photoelectron Spectra ◽  
X Ray ◽  
Line Shape Analysis

On line shape analysis in X-ray photoelectron spectroscopy

2001 ◽  
Vol 470 (3) ◽  
pp. 325-336 ◽  
Author(s):  
Wolfgang S.M. Werner ◽  
Thomas Cabela ◽  
Josef Zemek ◽  
Petr Jiricek
Keyword(s):  
Shape Analysis ◽  
Photoelectron Spectroscopy ◽  
Line Shape ◽  
X Ray ◽  
Line Shape Analysis ◽  
On Line

Line-Shape Analysis of High Resolution X-Ray Diffraction Spectra of Finite Size Thue-Morse GaAs-AlAs Multilayer Heterostructures

1995 ◽  
Vol 5 (1) ◽  
pp. 111-127 ◽  
Author(s):  
Jacques Peyrière ◽  
Eric Cockayne ◽  
Françoise Axel
Keyword(s):  
High Resolution ◽  
Shape Analysis ◽  
Line Shape ◽  
Finite Size ◽  
X Ray Diffraction ◽  
X Ray ◽  
Line Shape Analysis ◽  
Multilayer Heterostructures

Atomic structure and faulted boundaries in the GaAs(001)β(2×4)surface as derived from x-ray diffraction and line-shape analysis

1996 ◽  
Vol 54 (24) ◽  
pp. 17638-17646 ◽  
Author(s):  
Y. Garreau ◽  
M. Sauvage-Simkin ◽  
N. Jedrecy ◽  
R. Pinchaux ◽  
M. B. Veron
Keyword(s):  
Shape Analysis ◽  
Atomic Structure ◽  
Line Shape ◽  
X Ray Diffraction ◽  
X Ray ◽  
Line Shape Analysis
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