Surface roughness and correlation length determined from x-ray-diffraction line-shape analysis on germanium (111)

1989 ◽  
Vol 40 (5) ◽  
pp. 3480-3482 ◽  
Author(s):  
Q. Shen ◽  
J. M. Blakely ◽  
M. J. Bedzyk ◽  
K. D. Finkelstein
Keyword(s):  
Surface Roughness ◽  
Correlation Length ◽  
Shape Analysis ◽  
Line Shape ◽  
Diffraction Line ◽  
X Ray Diffraction ◽  
X Ray ◽  
Line Shape Analysis

scholarly journals 2-D X-ray diffraction line shape analysis of oxide epitaxial layers

2002 ◽  
Vol 58 (s1) ◽  
pp. c40-c40
Author(s):  
A. Boulle ◽  
O. Masson ◽  
R. Guinebretiere ◽  
A. Dauger
Keyword(s):  
Shape Analysis ◽  
Line Shape ◽  
Diffraction Line ◽  
Epitaxial Layers ◽  
X Ray Diffraction ◽  
X Ray ◽  
Line Shape Analysis

Glass transition in ferroic glass Kx(ND4)1−xD2PO4: a complete x-ray diffraction line shape analysis

2016 ◽  
Vol 3 (3) ◽  
pp. 035201
Author(s):  
Rajul Ranjan Choudhury ◽  
R Chitra ◽  
V B Jayakrishnan
Keyword(s):  
Glass Transition ◽  
Shape Analysis ◽  
Line Shape ◽  
Diffraction Line ◽  
X Ray Diffraction ◽  
X Ray ◽  
Line Shape Analysis

Line-Shape Analysis of High Resolution X-Ray Diffraction Spectra of Finite Size Thue-Morse GaAs-AlAs Multilayer Heterostructures

1995 ◽  
Vol 5 (1) ◽  
pp. 111-127 ◽  
Author(s):  
Jacques Peyrière ◽  
Eric Cockayne ◽  
Françoise Axel
Keyword(s):  
High Resolution ◽  
Shape Analysis ◽  
Line Shape ◽  
Finite Size ◽  
X Ray Diffraction ◽  
X Ray ◽  
Line Shape Analysis ◽  
Multilayer Heterostructures

Atomic structure and faulted boundaries in the GaAs(001)β(2×4)surface as derived from x-ray diffraction and line-shape analysis

1996 ◽  
Vol 54 (24) ◽  
pp. 17638-17646 ◽  
Author(s):  
Y. Garreau ◽  
M. Sauvage-Simkin ◽  
N. Jedrecy ◽  
R. Pinchaux ◽  
M. B. Veron
Keyword(s):  
Shape Analysis ◽  
Atomic Structure ◽  
Line Shape ◽  
X Ray Diffraction ◽  
X Ray ◽  
Line Shape Analysis

Surface Roughness and Correlation Length Determined from X-Ray Diffraction Line Shape Analysis on Germanium (111)

1988 ◽  
Vol 143 ◽  
Author(s):  
Q. Shen ◽  
J. M. Blakely ◽  
M. J. Bedzyk ◽  
K. D. Finkelstein
Keyword(s):  
Surface Roughness ◽  
Shape Analysis ◽  
Flat Surface ◽  
Polished Surface ◽  
Diffraction Experiment ◽  
X Ray Diffraction ◽  
X Ray ◽  
Line Shape Analysis ◽  
Crystal Truncation Rod ◽  
Lateral Scale

AbstractIn an x-ray diffraction experiment performed on a germanium (111) crystal, both the rod-like and the diffuse-like scattering from the surface have been observed on a nonspecular crystal truncation rod. These scattering contributions can be explained using existing theory on surface roughness. Two treatments to the Ge (111) surface have been used to provide examples with different roughness characteristics for this study. Quantitative analysis results in a surface roughness of 2.5+0.3Å for a clean surface passivated with iodine and 4.3+0.5Å for a Syton polished surface covered with a naturally grown oxide layer. A typical lateral scale of flat surface regions has also been obtained from the transverse width of the diffuse-like scattering peak, and found to be 200 A and 400 Å respectively.

An x-ray Fourier line shape analysis of hexagonal tellurium films II: Vacuum evaporated at low temperature (133 K)

1984 ◽  
Vol 122 (1) ◽  
pp. 73-91 ◽  
Author(s):  
Ela Chatterjee ◽  
S.P. Sen Gupta
Keyword(s):  
Low Temperature ◽  
Shape Analysis ◽  
Line Shape ◽  
X Ray ◽  
Line Shape Analysis

Line shape analysis of high energy X-ray induced Auger- and photoelectron spectra of thin Cu and Ni films

2002 ◽  
Vol 122 (2) ◽  
pp. 103-114 ◽  
Author(s):  
Wolfgang S.M. Werner ◽  
László Kövér ◽  
József Tóth ◽  
Dezsó Varga
Keyword(s):  
Shape Analysis ◽  
Line Shape ◽  
High Energy ◽  
Photoelectron Spectra ◽  
X Ray ◽  
Line Shape Analysis

On line shape analysis in X-ray photoelectron spectroscopy

2001 ◽  
Vol 470 (3) ◽  
pp. 325-336 ◽  
Author(s):  
Wolfgang S.M. Werner ◽  
Thomas Cabela ◽  
Josef Zemek ◽  
Petr Jiricek
Keyword(s):  
Shape Analysis ◽  
Photoelectron Spectroscopy ◽  
Line Shape ◽  
X Ray ◽  
Line Shape Analysis ◽  
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