Influence of substrate on high-temperature behavior of copper film studied in situ by electron backscatter diffraction
2005 ◽
Vol 34
(12)
◽
pp. 1509-1520
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2004 ◽
Vol 76
(1-4)
◽
pp. 160-166
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2007 ◽
Vol 561-565
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pp. 2087-2090
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2010 ◽
Vol 51
(4)
◽
pp. 659-663
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2005 ◽
pp. 399-404