The effect of δ-hydride on the micromechanical deformation of a Zr alloy studied by in situ high angular resolution electron backscatter diffraction

2019 ◽  
Vol 173 ◽  
pp. 101-105 ◽  
Author(s):  
Siyang Wang ◽  
Szilvia Kalácska ◽  
Xavier Maeder ◽  
Johann Michler ◽  
Finn Giuliani ◽  
...  
Keyword(s):  
Angular Resolution ◽  
Electron Backscatter Diffraction ◽  
High Angular Resolution ◽  
Resolution Electron ◽  
Electron Backscatter ◽  
Backscatter Diffraction ◽  
Zr Alloy

scholarly journals Selectively Electron-Transparent Microstamping Toward Concurrent Digital Image Correlation and High-Angular Resolution Electron Backscatter Diffraction (EBSD) Analysis

2017 ◽  
Vol 23 (6) ◽  
pp. 1091-1095 ◽  
Author(s):  
Timothy J. Ruggles ◽  
Geoffrey F. Bomarito ◽  
Andrew H. Cannon ◽  
Jacob D. Hochhalter
Keyword(s):  
Digital Image Correlation ◽  
Digital Image ◽  
Angular Resolution ◽  
Electron Backscatter Diffraction ◽  
Image Correlation ◽  
Ebsd Analysis ◽  
High Angular Resolution ◽  
Resolution Electron ◽  
Electron Backscatter ◽  
Backscatter Diffraction

AbstractDigital image correlation (DIC) in a scanning electron microscope and high-angular resolution electron backscatter diffraction (HREBSD) provide valuable and complementary data concerning local deformation at the microscale. However, standard surface preparation techniques are mutually exclusive, which makes combining these techniques in situ impossible. This paper introduces a new method of applying surface patterning for DIC, namely a urethane microstamp, that provides a pattern with enough contrast for DIC at low accelerating voltages, but is virtually transparent at the higher voltages necessary for HREBSD and conventional EBSD analysis. Furthermore, microstamping is inexpensive and repeatable, and is more suitable to the analysis of patterns from complex surface geometries and larger surface areas than other patterning techniques.

Stress induced martensite variants revealed by in situ high resolution electron backscatter diffraction (HR-EBSD)

2018 ◽  
Vol 151 ◽  
pp. 83-88 ◽  
Author(s):  
A. Arabi-Hashemi ◽  
Y. Guo ◽  
J. Michler ◽  
D. Casari ◽  
C. Leinenbach ◽  
...  
Keyword(s):  
High Resolution ◽  
Electron Backscatter Diffraction ◽  
Resolution Electron ◽  
Electron Backscatter ◽  
Backscatter Diffraction
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