In-Situ Transmission Electron Microscope High Temperature Behavior in Nanocrystalline Platinum Thin Films

JOM ◽  
2015 ◽  
Vol 68 (1) ◽  
pp. 109-115 ◽  
Author(s):  
Davil Garcia ◽  
Alexander Leon ◽  
Sandeep Kumar
Keyword(s):  
Thin Films ◽  
Electron Microscope ◽  
High Temperature ◽  
Transmission Electron Microscope ◽  
Temperature Behavior ◽  
High Temperature Behavior ◽  
Transmission Electron

In Situ High Resolution Transmission Electron Microscopy Studies of High Temperature Behavior of Surface Al2O3 Thin Layer on an AlN Particle

2011 ◽  
Vol 675-677 ◽  
pp. 123-126
Author(s):  
Hiroshi Fukushima ◽  
Masanobu Azuma ◽  
Yukihiro Kanechika
Keyword(s):  
High Temperature ◽  
Al2o3 Particle ◽  
Temperature Behavior ◽  
Heating Process ◽  
Protective Film ◽  
High Temperature Behavior ◽  
Transmission Electron ◽  
Al2o3 Particles ◽  
Edge Dislocations

A high temperature HRTEM holder equipped with a W-coil heater was used to make insitu observation of high temperature behavior of Al2O3 very thin (about 1 nm in thickness) protective film on AlN particles. The film was used to prevent AlN particles from damages by moisture. Rapid melting and rapid solidification of very small Al2O3 particles of about 2 nm in diameter were found within about 0.2 seconds. Therefore we concluded that the Al2O3 protective film worked as the sintering additives in the high temperature heating process. In the present study, very small Al2O3 particles were identified by the space between observed lattice fringe images. It was found that a tilt boundary was instantaneously formed and annihilated in an Al2O3 particle. There was also evidence that showed the formation and annihilation of edge dislocations within seven seconds during sintering.

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