In situ indentation of nanoporous gold thin films in the transmission electron microscope

2009 ◽  
Vol 72 (3) ◽  
pp. 232-241 ◽  
Author(s):  
Ye Sun ◽  
Jia Ye ◽  
Andrew M. Minor ◽  
T. John Balk
Keyword(s):  
Thin Films ◽  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Nanoporous Gold ◽  
Transmission Electron ◽  
Gold Thin Films

Remote On-Line Control of a High-Voltage in situ Transmission Electron Microscope with A Rational User Interface

1996 ◽  
Vol 54 ◽  
pp. 384-385
Author(s):  
M.A. O’Keefe ◽  
J. Taylor ◽  
D. Owen ◽  
B. Crowley ◽  
K.H. Westmacott ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Electron Microscope ◽  
User Interface ◽  
Transmission Electron Microscope ◽  
High Voltage ◽  
Materials Science ◽  
Transmission Electron ◽  
On Line ◽  
Electron Microscopes

Remote on-line electron microscopy is rapidly becoming more available as improvements continue to be developed in the software and hardware of interfaces and networks. Scanning electron microscopes have been driven remotely across both wide and local area networks. Initial implementations with transmission electron microscopes have targeted unique facilities like an advanced analytical electron microscope, a biological 3-D IVEM and a HVEM capable of in situ materials science applications. As implementations of on-line transmission electron microscopy become more widespread, it is essential that suitable standards be developed and followed. Two such standards have been proposed for a high-level protocol language for on-line access, and we have proposed a rational graphical user interface. The user interface we present here is based on experience gained with a full-function materials science application providing users of the National Center for Electron Microscopy with remote on-line access to a 1.5MeV Kratos EM-1500 in situ high-voltage transmission electron microscope via existing wide area networks. We have developed and implemented, and are continuing to refine, a set of tools, protocols, and interfaces to run the Kratos EM-1500 on-line for collaborative research. Computer tools for capturing and manipulating real-time video signals are integrated into a standardized user interface that may be used for remote access to any transmission electron microscope equipped with a suitable control computer.

In situ observation of ordering process in FePt films during annealing in a transmission electron microscope

2006 ◽  
Vol 99 (12) ◽  
pp. 123905 ◽  
Author(s):  
K. Kawai ◽  
S. Honda ◽  
M. Nawate ◽  
M. Komatsu ◽  
K. Kawabata
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
In Situ Observation ◽  
Transmission Electron
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