Characterization of Deep Sub-wavelength Sized Horizontal Cracks Using Holey-Structured Metamaterials

2019 ◽  
Vol 72 (11) ◽  
pp. 2917-2921 ◽  
Author(s):  
Mohamed Subair Syed Akbar Ali ◽  
Kiran Kumar Amireddy ◽  
Krishnan Balasubramaniam ◽  
Prabhu Rajagopal
Keyword(s):  
Sub Wavelength

Fourier Scatterometry for Characterization of Sub-wavelength Periodic Two Photon Polymerization Structures

2011 ◽  
Author(s):  
K. Frenner ◽  
V. Ferreras Paz ◽  
S. Peterhänsel ◽  
W. Osten ◽  
A. Ovsianikov ◽  
...  
Keyword(s):  
Two Photon ◽  
Sub Wavelength ◽  
Two Photon Polymerization

Electromagnetic Characterization of High Absorption Sub-Wavelength Optical Nanostructure Photovoltaics for Solar Energy Harvesting

2013 ◽  
Vol 61 (4) ◽  
pp. 1518-1527 ◽  
Author(s):  
Timothy J. Brockett ◽  
Harish Rajagopalan ◽  
Ramesh B. Laghumavarapu ◽  
Diana Hufakker ◽  
Yahya Rahmat-Samii
Keyword(s):  
Energy Harvesting ◽  
Solar Energy ◽  
Solar Energy Harvesting ◽  
High Absorption ◽  
Sub Wavelength

scholarly journals Near-field characterization of extraordinary optical transmission in sub-wavelength aperture arrays

2007 ◽  
Vol 15 (15) ◽  
pp. 9129 ◽  
Author(s):  
Michael Mrejen ◽  
Abraham Israel ◽  
Hesham Taha ◽  
Mila Palchan ◽  
Aaron Lewis
Keyword(s):  
Optical Transmission ◽  
Near Field ◽  
Extraordinary Optical Transmission ◽  
Aperture Arrays ◽  
Sub Wavelength

scholarly journals Error Assessment and Mitigation Methods in Transient Radar Method

Sensors ◽  
2020 ◽  
Vol 20 (1) ◽  
pp. 263
Author(s):  
Ali Pourkazemi ◽  
Salar Tayebi ◽  
Johan H. Stiens
Keyword(s):  
Error Correction ◽  
Single Layer ◽  
Correction Method ◽  
Radar Method ◽  
Mitigation Methods ◽  
Contact Free ◽  
Thickness Measurements ◽  
Dielectric Structures ◽  
Sub Wavelength

Transient Radar Method (TRM) was recently proposed as a novel contact-free method for the characterization of multilayer dielectric structures including the geometric details. In this paper, we discuss and quantify the intrinsic and systematic errors of TRM. Also, solutions for mitigating these problems are elaborated extensively. The proposed solution for error correction will be applied to quantify experimentally the thickness of several single-layer dielectric structures with thicknesses varying from larger to smaller than the wavelength. We will show how the error correction method allows sub-wavelength thickness measurements around λ / 5 .

scholarly journals Holistic characterization of complex transmittances generated by infrared sub-wavelength gratings

2008 ◽  
Vol 16 (10) ◽  
pp. 7060 ◽  
Author(s):  
Bruno Toulon ◽  
Grégory Vincent ◽  
Riad Haidar ◽  
Nicolas Guérineau ◽  
Stéphane Collin ◽  
...  
Keyword(s):  
Sub Wavelength

Diffractive Characterization of Sub-wavelength Objects with Machine Learning

2021 ◽  
Author(s):  
Abantika Ghosh ◽  
Diane J. Roth ◽  
Luke H. Nicholls ◽  
William P. Wardley ◽  
Anatoly Zayats ◽  
...  
Keyword(s):  
Machine Learning ◽  
Sub Wavelength
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