Characterization of Deep Sub-wavelength Sized Horizontal Cracks Using Holey-Structured Metamaterials

2019 ◽  
Vol 72 (11) ◽  
pp. 2917-2921 ◽  
Author(s):  
Mohamed Subair Syed Akbar Ali ◽  
Kiran Kumar Amireddy ◽  
Krishnan Balasubramaniam ◽  
Prabhu Rajagopal
Keyword(s):  
2011 ◽  
Author(s):  
K. Frenner ◽  
V. Ferreras Paz ◽  
S. Peterhänsel ◽  
W. Osten ◽  
A. Ovsianikov ◽  
...  

2013 ◽  
Vol 61 (4) ◽  
pp. 1518-1527 ◽  
Author(s):  
Timothy J. Brockett ◽  
Harish Rajagopalan ◽  
Ramesh B. Laghumavarapu ◽  
Diana Hufakker ◽  
Yahya Rahmat-Samii

2007 ◽  
Vol 15 (15) ◽  
pp. 9129 ◽  
Author(s):  
Michael Mrejen ◽  
Abraham Israel ◽  
Hesham Taha ◽  
Mila Palchan ◽  
Aaron Lewis

Sensors ◽  
2020 ◽  
Vol 20 (1) ◽  
pp. 263
Author(s):  
Ali Pourkazemi ◽  
Salar Tayebi ◽  
Johan H. Stiens

Transient Radar Method (TRM) was recently proposed as a novel contact-free method for the characterization of multilayer dielectric structures including the geometric details. In this paper, we discuss and quantify the intrinsic and systematic errors of TRM. Also, solutions for mitigating these problems are elaborated extensively. The proposed solution for error correction will be applied to quantify experimentally the thickness of several single-layer dielectric structures with thicknesses varying from larger to smaller than the wavelength. We will show how the error correction method allows sub-wavelength thickness measurements around λ / 5 .


2008 ◽  
Vol 16 (10) ◽  
pp. 7060 ◽  
Author(s):  
Bruno Toulon ◽  
Grégory Vincent ◽  
Riad Haidar ◽  
Nicolas Guérineau ◽  
Stéphane Collin ◽  
...  
Keyword(s):  

2021 ◽  
Author(s):  
Abantika Ghosh ◽  
Diane J. Roth ◽  
Luke H. Nicholls ◽  
William P. Wardley ◽  
Anatoly Zayats ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document