Studies of falling liquid film flow Film thickness on a smooth vertical plate

1963 ◽  
Vol 18 (12) ◽  
pp. 787-804 ◽  
Author(s):  
S. Portalski
Author(s):  
Kenji Yoshida ◽  
Hidenobu Tanaka ◽  
Keizo Matsuura ◽  
Isao Kataoka

Experimental and numerical studies were made to investigate the effects of wavy interface on the liquid film to gas-phase turbulence modification of air-water annular flow in a vertically arranged round tube. By using the constant temperature hotwire anemometer, time-averaged axial velocity profiles, turbulence fluctuation profiles, energy spectrum and auto-correlation coefficient for fluctuation velocity component of gas-phase axial velocity were precisely measured. The liquid film thickness was also measured by using point-electrode resistivity probe to make clear the time-averaged liquid film thickness and wave height moving on the liquid film. Direct observations using high speed video camera were also added to make clear the dynamic behavior and propergating velocity of ripple or disturbance waves on liquid film flow. Numerical simulations for gas-phase turbulence in annular flow considering the effect of wavy interface of liquid film flow were also carried out. Liquid film flow was modeled to be the wall surface roughness of interfacial wave height moving with the interfacial velocity. The roughness and moving velocity of the modeled liquid film for computational condition were provided by the present experimental results. Time-averaged velocity profiles and fluctuation velocity profiles were calculated with standard k-ε model. Numerical results were generally consistent with the experimental results obtained in the present study.


2013 ◽  
Vol 52 (13) ◽  
pp. 4950-4956 ◽  
Author(s):  
Bo Sun ◽  
Ming Zhu ◽  
Bo Tan Liu ◽  
Chun Jiang Liu ◽  
Xi Gang Yuan

2010 ◽  
Vol 132 (8) ◽  
Author(s):  
H. Lan ◽  
J. L. Wegener ◽  
B. F. Armaly ◽  
J. A. Drallmeier

Three-dimensional (3D)—steady-developing-laminar-isothermal—and gravity-driven thin liquid film flow adjacent to an inclined plane is examined and the effects of film flow rate, surface tension, and surface inclination angle on the film thickness and film width are presented. The film flow was numerically simulated using the volume of fluid model and experimental verification was conducted by measuring film thickness and width using a laser focus displacement instrument. The steady film flow that is considered in this study does not have a leading contact line, however, it has two steady side contact lines with the substrate surface at the outer edge of its width. Results reveal that the film width decreases and the average film thickness increases as the film flows down the inclined plane. The film thickness and width decrease but its streamwise velocity increases as surface inclination angle (as measured from the horizontal plane) increases. A higher film flow rate is associated with a higher film thickness, a higher film width, and a higher average film velocity. Films with higher surface tension are associated with a smaller width and a higher average thickness. A ripple develops near the side contact line, i.e., the spanwise distribution of the film thickness exhibits peaks at the outer edges of the film width and the height of this ripple increases as the surface tension or the film flow rate increases. The width of the film decreases at a faster rate along the streamwise direction if liquid film has higher surface tension. Measurements of the film thickness and the film width compare favorably with the numerically simulated results.


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