Characterization of flame spread over PMMA using holographic interferometry sample orientation effects

1988 ◽  
Vol 71 (2) ◽  
pp. 189-204 ◽  
Author(s):  
Akihiko Ito ◽  
Takashi Kashiwagi
Keyword(s):  
Flame Spread ◽  
Holographic Interferometry ◽  
Orientation Effects ◽  
Sample Orientation

scholarly journals High-resolution characterization of the forbidden Si 200 and Si 222 reflections

2015 ◽  
Vol 48 (2) ◽  
pp. 528-532 ◽  
Author(s):  
Peter Zaumseil
Keyword(s):  
High Resolution ◽  
Angular Range ◽  
Angular Divergence ◽  
X Ray Diffraction ◽  
Multiple Diffraction ◽  
Diffraction Plane ◽  
X Ray ◽  
Sample Orientation ◽  
Plane Sample

The occurrence of the basis-forbidden Si 200 and Si 222 reflections in specular X-ray diffraction ω–2Θ scans is investigated in detail as a function of the in-plane sample orientation Φ. This is done for two different diffractometer types with low and high angular divergence perpendicular to the diffraction plane. It is shown that the reflections appear for well defined conditions as a result of multiple diffraction, and not only do the obtained peaks vary in intensity but additional features like shoulders or even subpeaks may occur within a 2Θ range of about ±2.5°. This has important consequences for the detection and verification of layer peaks in the corresponding angular range.

Study of Flame Spread Over JP8 Using 2-D Holographic Interferometry

1998 ◽  
Vol 16 (6) ◽  
pp. 437-457 ◽  
Author(s):  
Ghassan Tashtoush ◽  
Kozo Saito ◽  
Clifford Cremers ◽  
Louis Gritzo
Keyword(s):  
Flame Spread ◽  
Holographic Interferometry

Characterization of the flame spread behavior and flammability of heterogeneous fuels using a measured B number

Fuel ◽  
2022 ◽  
Vol 308 ◽  
pp. 121919
Author(s):  
Hanyu Xiong ◽  
Xiaolei Zhang ◽  
Yanli Miao ◽  
Longhua Hu
Keyword(s):  
Flame Spread

Characterization of electrodeposited Bi2S3 thin films by holographic interferometry

2009 ◽  
Vol 282 (15) ◽  
pp. 3127-3131 ◽  
Author(s):  
N.S. Shinde ◽  
M.C. Rath ◽  
H.D. Dhaigude ◽  
C.D. Lokhande ◽  
V.J. Fulari
Keyword(s):  
Thin Films ◽  
Holographic Interferometry

Digital holographic interferometry for characterization of transparent materials

2001 ◽  
Author(s):  
Pietro Ferraro ◽  
Sergio De Nicola ◽  
Andrea Finizio ◽  
Simonetta Grilli ◽  
Giovanni Pierattini
Keyword(s):  
Holographic Interferometry ◽  
Transparent Materials
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