Leakage current reduction due to hot carrier effects in n-channel polycrystalline silicon thin film transistors

1995 ◽  
Vol 187 ◽  
pp. 195-198 ◽  
Author(s):  
G. Tallarida ◽  
A. Pecora ◽  
G. Fortunato ◽  
F. Plais ◽  
P. Legagneux ◽  
...  
2007 ◽  
Vol 46 (3B) ◽  
pp. 1299-1302 ◽  
Author(s):  
Luigi Mariucci ◽  
Paolo Gaucci ◽  
Antonio Valletta ◽  
François Templier ◽  
Guglielmo Fortunato

2006 ◽  
Vol 89 (18) ◽  
pp. 183518 ◽  
Author(s):  
L. Mariucci ◽  
A. Valletta ◽  
P. Gaucci ◽  
G. Fortunato ◽  
F. Templier

1999 ◽  
Vol 85 (9) ◽  
pp. 6917-6919 ◽  
Author(s):  
F. V. Farmakis ◽  
C. A. Dimitriadis ◽  
J. Brini ◽  
G. Kamarinos ◽  
V. K. Gueorguiev ◽  
...  

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