Leakage current reduction due to hot carrier effects in n-channel polycrystalline silicon thin film transistors
1995 ◽
Vol 187
◽
pp. 195-198
◽
Keyword(s):
Keyword(s):
2015 ◽
Vol 15
(1)
◽
pp. 82-85
◽
Keyword(s):
1996 ◽
Vol 51-52
◽
pp. 585-596
◽
2007 ◽
Vol 46
(3B)
◽
pp. 1299-1302
◽
Keyword(s):
Keyword(s):
1999 ◽
Vol 39
(1)
◽
pp. 45-52
◽
1994 ◽
Vol 41
(3)
◽
pp. 340-346
◽
Keyword(s):
Keyword(s):
Keyword(s):