Influences of Grain Boundaries on Temperature Dependence of Device Characteristics and on Hot Carrier Effects in Low-Temperature Polycrystalline Silicon Thin Film Transistors Containing Large Grains

2007 ◽  
Vol 46 (3B) ◽  
pp. 1312-1317
Author(s):  
Toshiaki Tsuchiya ◽  
Takafumi Miura ◽  
Tsubasa Yamai ◽  
Genshiro Kawachi ◽  
Masakiyo Matsumura
Keyword(s):  
Thin Film ◽  
Low Temperature ◽  
Temperature Dependence ◽  
Grain Boundaries ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Silicon Thin Film ◽  
Hot Carrier ◽  
Hot Carrier Effects

Hot Carrier Effects in p-Channel Polycrystalline Silicon Thin Film Transistors Fabricated on Flexible Substrates

2007 ◽  
Vol 46 (3B) ◽  
pp. 1299-1302 ◽  
Author(s):  
Luigi Mariucci ◽  
Paolo Gaucci ◽  
Antonio Valletta ◽  
François Templier ◽  
Guglielmo Fortunato
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Flexible Substrates ◽  
Silicon Thin Film ◽  
Hot Carrier ◽  
Hot Carrier Effects

Leakage current reduction due to hot carrier effects in n-channel polycrystalline silicon thin film transistors

1995 ◽  
Vol 187 ◽  
pp. 195-198 ◽  
Author(s):  
G. Tallarida ◽  
A. Pecora ◽  
G. Fortunato ◽  
F. Plais ◽  
P. Legagneux ◽  
...  
Keyword(s):  
Thin Film ◽  
Leakage Current ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Silicon Thin Film ◽  
Hot Carrier ◽  
Hot Carrier Effects ◽  
Current Reduction
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